Growth mechanism of two-component titania/vanadium oxide thin films from aqueous solutions

双组分二氧化钛/氧化钒薄膜在水溶液中的生长机理

• 批准号: 28197821
• 负责人: Professor Dr. Joachim Bill
• 金额: --
• 依托单位: Abteilung Chemische Materialsynthese
• 依托单位国家: 德国
• 项目类别: Research Grants
• 财政年份: 2006
• 资助国家: 德国
• 起止时间: 2005-12-31 至 2010-12-31
• 项目状态: 已结题
• 来源: https://gepris.dfg.de/gepris/projekt/28197821?language=en
• 关键词: Growth; mechanism; two; component; titania

The synthesis and characterization of two-component titania/vanadium oxide films and powders with respect to their potential application in electrochromic devices (¿Smart Window¿) and antimicrobial coatings is proposed. For the fabrication of the films thermohydrolytic reactions in aqueous solutions at temperatures below 100°C will be used (Chemical Bath Deposition). In general this procedure allows the coating of complex shaped surfaces and provides a simple route for patterned coatings as well as an economical alternative to conventional deposition from the gas phase. The films will be tested for photocatalytic activity by measuring the photodegredation of organic compounds. Investigations on morphology, microstructure and chemical composition of the films will be combined with studies on the formation mechanism by UV/VIS spectroscopy and dynamic light scattering experiments. Further studies will include advanced atomic force microscopy in fluid cells to obtain force-distance curve measurements of model systems related to the film formation and the assessment of these results.

提出了两种组分二氧化物/钒氧化物膜和粉末在电染料设备（€Smart Window）和抗菌涂层中的潜在应用和粉末的合成和表征。为了制造膜在水溶液中在低于100°C的水溶液中的热液化反应（化学浴沉积）。通常，此过程允许复杂形状的表面涂层，并为图案涂层提供了简单的途径，以及从气相中传统沉积的经济替代方案。将通过测量有机化合物的光降期来测试膜的光催化活性。对膜的形态，微观结构和化学组成的研究将与紫外线/VIS光谱和动态光散射实验的形成机理进行研究。进一步的研究将包括流体细胞中的晚期原子力显微镜，以获得与膜形成相关的模型系统和这些结果评估的模型系统的测量。

项目成果

Synthesis of V-doped TiO2 films by chemical bath deposition and the effect of post-annealing on their properties

• DOI: 10.1016/j.tsf.2012.03.047
• 发表时间: 2012-07
• 期刊: Thin Solid Films
• 影响因子: 2.1
• 作者: D. Shopova-Gospodinova;L. Jeurgens;U. Welzel;L. P. Bauermann;R. Hoffmann;J. Bill