Compressed Sensing in Ptychography and Transmission Electron Microscopy

叠印术和透射电子显微镜中的压缩传感

• 批准号: 319898174
• 负责人: Dr. Wouter van den Broek, Ph.D.
• 金额: --
• 依托单位: Leibniz-Institut für Kristallzüchtung (IKZ)
• 依托单位国家: 德国
• 项目类别: Research Grants
• 财政年份: 2016
• 资助国家: 德国
• 起止时间: 2015-12-31 至 2020-12-31
• 项目状态: 已结题
• 来源: https://gepris.dfg.de/gepris/projekt/319898174?language=en
• 关键词: Compressed; Sensing; Ptychography; Transmission; Electron

This project uses compressed sensing to improve object retrieval from ptychographic data sets consisting out of HRTEM images and diffraction patterns, and to speed up data recording and thus decrease electron dose and specimen damage. More specifically, a SEM will be equipped with fast phase imaging in transmission, and super-resolution will be attained in the TEM by near-field ptychography. After having validated the techniques with standard samples of increasing complexity, the challenging case of metal and metal oxide clusters synthesized in the gas phase by laser evaporation cluster sources is taken on.

该项目使用压缩传感来改进从由HRTEM图像和衍射图组成的层析数据集中检索对象，并加快数据记录速度，从而减少电子剂量和样品损坏。更具体地说，扫描电子显微镜将在传输中配备快速相位成像，而在瞬变显微镜中将通过近场光刻获得超分辨率。在用越来越复杂的标准样品验证了这些技术之后，我们采用了激光蒸发团簇光源在气相中合成金属和金属氧化物团簇这一具有挑战性的案例。

项目成果

Towards Ptychography with Structured Illumination, and a Derivative-Based Reconstruction Algorithm

走向具有结构化照明的叠层印刷术和基于导数的重建算法

• DOI: 10.1017/s1431927619001028
• 发表时间: 2019
• 期刊: Microscopy and Microanalysis
• 影响因子: 2.8
• 作者: W. Van den Broek;M. Schloz;T.C. Pekin;P. M. Pelz;P.-H. Lu;M. Kruth;V. Grillo;R. E. Dunin-Borkowski;R. J. D. Miller;C.T. Koch
• 通讯作者: C.T. Koch

Various Compressed Sensing Setups Evaluated Against Shannon Sampling Under Constraint of Constant Illumination

在恒定照明约束下针对香农采样评估各种压缩感知设置

• DOI: 10.1109/tci.2019.2894950
• 发表时间: 2019
• 期刊: IEEE Transactions on Computational Imaging
• 影响因子: 5.4
• 作者: W. Van den Broek;B.W. Reed;A. Béché;A. Velazco;J. Verbeeck;C.T. Koch
• 通讯作者: C.T. Koch

Viability of Compressed Sensing as a Dose Reduction Strategy in STEM

压缩感知作为 STEM 中剂量减少策略的可行性

• DOI: 10.1017/s1431927619009164
• 发表时间: 2019
• 期刊: Microscopy and Microanalysis
• 影响因子: 2.8
• 作者: W. Van den Broek;B.W. Reed;A. Béché;J. Verbeeck;C.T. Koch
• 通讯作者: C.T. Koch

Comparison of Ptychography vs. Center-of-mass Analysis of Registered 4D-STEM Series

已注册 4D-STEM 系列的叠层成像与质心分析的比较

• DOI: 10.1017/s1431927620019765
• 发表时间: 1900
• 期刊: Microscopy and Microanalysis
• 影响因子: 2.8
• 作者: B. Haas;M. Schloz;A. Mittelberger;T. Lovejoy;J. Müller;O. Krivanek;L. Jones;W. Van den Broek;C.T. Koch
• 通讯作者: C.T. Koch

Adaptive Scanning in Ptychography through Deep Reinforcement Learning

• DOI: 10.1017/s1431927621003238
• 发表时间: 2021-07
• 期刊: Microscopy and Microanalysis
• 影响因子: 2.8
• 作者: M. Schloz;Johannes Müller;T. Pekin;W. Van den Broek;C. Koch