Electron micrograph imaging of a single protein without staining

未经染色的单一蛋白质的电子显微成像

• 批准号: 24651118
• 负责人: KIMURA Keisaku
• 金额: $ 2.5万
• 依托单位: Hosei University (2013)University of Hyogo (2012)
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Challenging Exploratory Research
• 财政年份: 2012
• 资助国家: 日本
• 起止时间: 2012-04-01 至 2014-03-31
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-24651118/
• 关键词: 無染色画像; 電子顕微鏡基板; グラフェンオキシド; 単分子タンパク質; 透過走査電子顕微鏡

The object of this research is an imaging of a single protein molecule by a scanning transmission electron microscope (STEM) without staining. The key technology of this research is using a graphene oxide (GO) film as a substrate for STEM observation. The target resolution is 1 nm in the level of lysozyme protein. The outcome of the project were1) Development of a single layer GO film on a Cu microgrid. 2) Preparation of protein sample on a GO single layer under low acceleration voltage without loss of resolution. 3) STEM monitoring of a single NADH ubiquinone reductase whose size is 20 nm without uranyl staining on a GO film.

本研究的目的是通过扫描透射电子显微镜（STEM）对单个蛋白质分子进行无染色成像。本研究的关键技术是使用氧化石墨烯（GO）薄膜作为STEM观察的基底。在溶菌酶蛋白质水平上，目标分辨率为1nm。该项目的成果是1）在Cu微电网上开发单层GO膜。2)在低加速电压下在GO单层上制备蛋白质样品而不损失分辨率。3)STEM监测单个NADH泛醌还原酶，其尺寸为20 nm，在GO膜上没有铀酰染色。

项目成果

Stability of Graphene Oxide Film to Electron Beam Irradiation and Possible Thickness Dependence of Electron Attenuation

• DOI: 10.1246/bcsj.20120267
• 发表时间: 2013-03
• 期刊: Bulletin of the Chemical Society of Japan
• 影响因子: 4
• 作者: T. Sugimoto;K. Kimura

Measurement of the index of refraction of micron-meter crystals by a confocal laser microscope - Potential application for the refractive index mapping of micron-meter scale

用共焦激光显微镜测量微米晶体的折射率 - 微米尺度折射率映射的潜在应用

• 发表时间: 2014
• 期刊: Review of Scientific Instruments
• 影响因子: 1.6
• 作者: Keisaku Kimura and Seiichi Sato;K.Kimura and S.Sato
• 通讯作者: K.Kimura and S.Sato

Measurement of the index of refraction of micron-meter crystals by a confocal laser microscope–Potential application of the refractive index mapping of micron-meter scale

共焦激光显微镜测量微米晶体的折射率——微米尺度折射率测绘的潜在应用

• 发表时间: 2014
• 期刊: Review of Scientific Instruments
• 影响因子: 1.6
• 作者: Keisaku Kimura and Seiichi Sato