Development of new high-frequency nano-spin measurement technique

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This study reports our newly proposed high-frequency nano-spin measurement technique, that is, beating field typed high-frequency magnetic force microscope. The beating field is produced by supplying a signal current to the CPW and a reference current to an exciting coil. The signal current is fixed at a specific GHz-range frequency, while the reference is adjusted to produce a beat with a frequency near the cantilever resonance frequency. As the MFM tip is excited by the beat, the gradient of magnetic field can be successfully observed above the CPW surface for a GHz-range signal frequency. The gradient of magnetic field is minimized near the two gaps, but is maximized near the center of the signal line. These results demonstrate that the tip interacts closely with the RF magnetic near-field of the CPW through the beating field, and exploring a reference RF field can detect the distribution of RF magnetic fields radiated from a RF circuit component with a very high spatial resolution.