Combined / Integrated Optical Tweezers and Atomic Force Microscope System

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In this proposal, a specialized and tailor-designed instrument made up of a combination of an Atomic Force Microscope (AFM) and a dual beam Optical Tweezers (OT) system, referred to as OT-AFM-Combo System, is being requested. The fundamental idea behind the proposal for this instrument concerns the establishment of an integrated platform for simultaneous or sequential single molecule / object manipulation and single molecule analysis with high precision chemical and physical surface characterization. This will allow innovative experiments to be performed, which would improve the fundamental understanding of intermolecular interactions at solid-liquid-interfaces. The OT-AFM-Combo System is necessary in order to study solid-liquid-interfaces in detail at a mesoscopic level concomitantly with single object manipulation. Moreover, the system is necessary for performing local chemical functionalization (using the OT part) and imminent surface analysis (using the AFM part) to directly understand the role played by local structure on the efficiency of chemical functionalization. The effect of functionalization on the local surface chemical and physical properties can be deciphered in this manner. It is important that the equipment is installed minimizing vibrations and with the maximum possible versatility for interfacing external equipment and for future expansions / upgrades.