Scanning electron microscope with low vacuum mode, EDX analytics system and EM sample preparation (critical point dryer and high vacuum coater)
Scanning electron microscope with low vacuum mode, EDX analytics system and EM sample preparation (critical point dryer and high vacuum coater)
批准号:
426688606
负责人:
金额:
$0.0万
依托单位:
依托单位国家:
德国
项目类别:
Major Research Instrumentation
财政年份:
2019
资助国家:
德国
项目状态:
未结题
起止时间:
2018-12-31 至 --
中文摘要
拜罗伊特大学生物系的重点实验室电子显微镜支持生命科学中所有需要透射或扫描电子显微镜的工作组。此外,重点实验室开展自己的研究项目,并在一个中央项目中支持2092年跨区域DFG研究单位。重点实验室的扫描电子显微镜于2016年退役,因为它在技术上已经过时,极易受到干扰,因此不能再经济地运行。原来的电子显微镜将被这里申请的设备取代,从而保持重点实验室的扫描电子显微镜和能量色散X射线光谱分析。此外,它还打算用这里应用的最先进的临界点干燥机和高真空镀膜机来取代过时的样品制备设备。之所以需要所需的设备,主要是因为近年来有几个新的工作组加入了生物系,其当前和计划的研究项目(例如SFB 1357)需要大量使用扫描电子显微镜。许多项目需要非常耗时的测量,例如形态特征的量化或方法的开发和改进。由于拜罗伊特大学已有的扫描电子显微镜利用率很高,无法提供必要的测量时间。因此,所申请的装置对于当前和未来的研究项目的实现至关重要。
英文摘要
The Key Lab Electron Microscopy of the biological department at the University of Bayreuth supports all working groups in life sciences that require transmission or scanning electron microscopy. In addition, the Key Lab carries out its own research projects and supports the supra-regional DFG research unit FOR 2092 in a central project. The scanning electron microscope in the Key Lab was decommissioned in 2016 because it was technically outdated and highly prone to interference and could therefore no longer be operated economically. The original electron microscope is intended to be replaced by the device applied for here, and thus to keep scanning electron microscopy and the energy dispersive X-ray spectroscopy available in the Key Lab. Additionally, it is intended to replace the outdated sample preparation equipment with the state-of-the-art critical point dryer and the high vacuum coater applied for here. The necessity for the requested device is mainly based on the fact that several new working groups have joined the biology department in recent years, whose current and planned research projects (e.g. SFB 1357) require intensive use of scanning electron microscopy. Many projects require very time consuming measurements, e.g. for the quantification of morphological features or to the development and refinement of methods. Due to the very high utilization of the scanning electron microscopes already available at the University of Bayreuth, the necessary measuring time cannot be provided. Therefore, the device applied for here is of utmost importance for the realization of current and future research projects.
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