High-resolution Scanning Electron Microscope with EDX

扫描电子显微镜与EDX是一种分析方法，是当今固体化学和材料开发的许多领域不可或缺的。在基尔大学无机化学研究所（CAU）任命Malte Behrens教授的过程中，正在申请一种带有EDX探测器的扫描电子显微镜，以取代该研究所已有25年历史的设备，该设备在任何方面都不再是最先进的，并且由于无法修复的缺陷，最近只能提供分辨率在微米范围内的图像。这给整个研究所造成了一个必须填补的空白。该设备将主要由主申请人Malte Behrens教授博士的工作组使用，也可由无机化学的同事使用，并将以服务模式提供给我校所有其他成员。这与CAU的纳米和界面科学特别相关，它们被捆绑在全校范围的研究重点KiNSIS（基尔纳米表面和界面科学）中。计划中的研究，特别是纳米材料的表征，需要采购配备有场发射器和透镜内探测器的高分辨率仪器，这是该领域的最新技术。为了通过分析材料对比来表征样品的均匀性，该仪器还必须具有强大的疯牛病检测器。此外，采购STEM探测器也是必要的，因为这可以进行大量的调查，例如对孔隙结构的调查，否则必须使用透射电子显微镜进行，这要复杂得多，而且可用性非常有限。此外，采购灵敏的EDX探测器对于计划进行广泛的定性和定量分析是必要的，特别是纳米颗粒。该设备还必须允许在更高压力（可变压力模式）下进行测量，以便能够详细研究电绝缘样品。最后，采购惰性转移系统是必要的，以便能够检查空气敏感样品，例如活化或催化试验后产生的催化剂，以及电池材料。这里应用的设备配置大大扩展了研究所，KiNSIS以及整个大学的实验可能性，对于计划的调查至关重要，特别是在多相催化领域，以及应用程序中详细描述的所有其他项目。

Scanning electron microscopy with EDX is an analytical method that is nowadays indispensable in many areas of solid state chemistry and material development. In the course of the appointment of Prof. Dr. Malte Behrens to the Institute of Inorganic Chemistry at Kiel University (CAU), an application is therefore being made for a scanning electron microscope with EDX detector to replace a 25-year-old device at the institute that is no longer state of the art in any way and, due to an irreparable defect, has recently only been able to provide images with a resolution in the micrometer range. This has created a gap for the entire institute that must be filled. This device will be used mainly by the working group of the main applicant Prof. Dr. Malte Behrens, but also by the colleagues of the Inorganic Chemistry and will be available in the service mode to all other members of our university. This is especially relevant for the nano and interface sciences at CAU, which are bundled in the university-wide research focus KiNSIS (Kiel Nano Surface and Interface Science). The planned investigations, especially the characterization of nanomaterials, require the procurement of a high-resolution instrument equipped with a field emitter as well as an in-lens detector, which is state of the art in this field. For the characterization of the samples with respect to their homogeneity by analyzing the material contrast, the instrument must also have a powerful BSE detector. In addition, the procurement of a STEM detector is also necessary, as this allows a large number of investigations, for example on the pore structure, which otherwise had to be carried out using transmission electron microscopy, which is much more complex and has very limited availability. In addition, the procurement of a sensitive EDX detector is necessary for the planned extensive qualitative and quantitative analyses, especially of nanoparticles. The device must also allow measurements at higher pressures (variable pressure mode) in order to be able to investigate electrically insulating samples in detail. Finally, the procurement of an inert transfer system is necessary in order to be able to examine air-sensitive samples, such as catalysts produced after activation or after catalytic tests, but also battery materials. The equipment configuration applied for here considerably expands the experimental possibilities at the institute, within KiNSIS as well as at the entire university and is essential for the planned investigations, especially in the field of heterogeneous catalysis, but also in all other projects described in detail in the application.