Near-Field Scanning Optical Microscope for high resolution static and dynamic magnetic microscopy

我们计划建立一个高分辨率的磁显微镜，用于检测纳米磁性元件的静态和动态特性。该系统的核心是一个扫描散射近场显微镜，我们将修改尖端增强布里渊光散射。我们设想在静态和时间分辨模式下的磁分辨率优于50 nm。布里渊光散射检测单元-串联法布里-珀罗干涉仪-也将用于相邻的组合时间分辨磁光克尔/布里渊光散射显微镜，该显微镜计划在低至4K的低温和高达67 GHz的高频下工作。

We plan to set up a high resolution magnetic microscope for the detection of static and dynamic properties of nanosized magnetic elements. The core of the system is a scanning scattering near field microscope that we will modify for tip enhanced Brillouin light scattering. We envision a magnetic resolution in static and time resolved mode better than 50 nm. The Brillouin light scattering detection unit - a Tandem Fabry Perot interferometer - will also be used in an adjacent combined time resolved magneto-optic Kerr/Brillouin Light Scattering microscope that is planned to work at low temperatures down to 4K and up to high frequencies of 67 GHz.