Study on Physico-mathematical Model of Dc Flashover Phenomena of Contaminated Insulators

污污绝缘子直流闪络现象物理数学模型研究

• 批准号: 04650235
• 负责人: NAITO Katsuhiko
• 金额: $ 1.34万
• 依托单位: Nagoya Institute of Technology
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for General Scientific Research (C)
• 财政年份: 1992
• 资助国家: 日本
• 起止时间: 1992 至 1993
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-04650235/
• 关键词: Dc Insulator; Physico-mathematical Model; Flashover; Contaminated Condition; Insoluble Material; Ambient Temperature; Pressure; Surface Wetting; 漏れ電流; 避雷器; 汚損フラッシオーバ現象; 導電性物質; 人工汚損試験; 大気圧

The purpose of this study is to construct a physico-mathematical model of de fiashover phenomena of contaminated insulators as well as to evaluate factors experimentally which affect flashover phenomena. The main results obtained during this study are as follows :1. The results of worldwide round-robin artificial contamination test on dc high voltage insulators were analyzed. Improvement information which will serve for the revision of the existing international standard of dc contamination test.2. Dc flashover phenomena are affected by the kinds of insoluble materials in the contaminant.3. Ambient temperature and pressure have significant influence on dc flashover voltage.4. Wetting condition on the insulator surface has to be considereded.5. Analysis of leakage current waveforms obtained in dc contamination tests proved that waveforms depend on the shape and size of specimen and that relatively large current flows for about one second in some casess.6. A model considering electrostatic capacitance was constructed in the case of ac voltage application. The calculated leakage current waveform based on the model is almost the same with the experimental one, suggesting the validity of the model.7. Time variation of ac voltage distribution along series arrestors during the drying process of insulator surface was calculated by using a newly constructed model. It was shown that unusual voltage distribution 1.8 times as large as the normal may was obtained in a typical case.Construction of a physico-mathematical model in the case of dc voltage application is now in progress.

本研究的目的是建立污秽绝缘子闪络现象的物理数学模型，并对影响污闪现象的因素进行实验评估。主要研究结果如下：1.分析了世界范围内直流高压绝缘子人工污秽循环试验结果。为修订现行直流污染试验国际标准提供改进信息.直流污闪现象受污染物中不溶物质种类的影响。3.环境温度和气压对直流闪络电压有显著影响.必须考虑绝缘子表面的润湿情况。对直流污染试验中得到的泄漏电流波形进行分析，证明波形取决于试样的形状和尺寸，在某些情况下，相对较大的电流会持续约1秒.在交流电压作用下，建立了考虑静电电容的模型。基于该模型计算的漏电流波形与实验结果基本一致，表明了该模型的有效性.利用新建立的模型计算了绝缘子表面干燥过程中交流电压分布沿着串联电阻随时间的变化。结果表明，在典型情况下，得到的异常电压分布是正常情况下的1.8倍。目前正在建立直流电压应用情况下的物理数学模型。

项目成果

長屋 行則,内藤 克彦: "周囲温度が汚損フラッシオーバ電圧に及ぼす影響" 平成4年度電気関係学会 東海支部連合大会論文集. 55 (1993)

Yukinori Nagaya、Katsuhiko Naito：“环境温度对污染闪络电压的影响”1992 年电气工程学会东海分会会议记录 55 (1993)。

K.Naito & H.M.Schneider: "Round-robin Artificial Contamination Test on High Voltage Dc Insulators" IEEE Power Engineering Society 1994 Summer Meeting. (to be presented). (1994)

内藤康夫

林 樹弘,内藤 克彦: "汚損による交流絶縁低下の物理数学モデルに関する一考察" 平成5年電気学会全国大会論文集. 10. 74 (1993)

Kihiro Hayashi、Katsuhiko Naito：“由于污染造成的交流绝缘劣化的物理数学模型的研究”1993 年日本电气工程师协会全国会议论文集 10. 74 (1993)。

林樹弘,内藤克彦: "避雷器の汚損時の挙動の数値解析" 平成5年度電気関係学会東海支部連合大会論文集. No.111 (1993)

Kihiro Hayashi、Katsuhiko Naito：“避雷器受污染时行为的数值分析”1993 年电气工程学会东海分会联合会会议记录第 111 号（1993 年）。

林樹弘,水野幸男,内藤克彦: "2段積汚損避雷器の電圧分担に関する数値解析" 平成6年電気学会全国大会論文集. No.1447 (1994)

Kihiro Hayashi、Yukio Mizuno、Katsuhiko Naito：“两级脏浪涌放电器中的电压共享的数值分析”1994 年日本电气工程师协会全国会议论文集，第 1447 号（1994 年）。