Development of curved crystal spectrometer for soft X-ray emission spectroscopy

软X射线发射光谱曲面晶体光谱仪的研制

• 批准号: 10554012
• 负责人: NAKAI Shun-ichi
• 金额: $ 9.86万
• 依托单位: Utsunomiya University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B).
• 财政年份: 1998
• 资助国家: 日本
• 起止时间: 1998 至 2000
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-10554012/
• 关键词: Soft X-ray Spectrometer; X-ray Crystal Spectrometer; Position Sensitive Detector; Soft X-ray Monochrometor; Soft X-ray Spectroscopy; 軟X線分光法

Soft X-ray resonant emission spectroscopy is one of powerful methods to study the information about the electronic structure of solids. The synchrotron radiation is selected by the double crystal monochrometor. The secondary X-ray emission spectra(fluorescence spectra)from sample are analyzed by the secondary monochrometor. However, the intensity of the secondary radiation is generally weak, then we developed the new high resolution, high efficiency spectrometer. In order to achieve high efficiency, we developed the bent crystal spectrometer equipped with the position sensitive detector.We designed the new soft X-ray spectrometer. The spectrometer is the bent crystal vacuum spectrometer of Johann type, in which a bent crystal of radius of curvature 100cm is mounted. The analyzing crystal with its atomic planes parallel to the face is placed tangent to a circle corresponding to the Rowland circle. The position sensitive detector is placed tangent to this circle.The test measurement of this spectrometer was performed by using Si K_α emission spectra from Silicon target. In this case, the electron beam(3KV, 80μA)from electron gun was used for excitation source. The resolution of the spectrometer was estimated about 0.5 eV for Si K_α region. Three type detectors, microchannel plate, resistive anode gas proportional counter and backgammon type position sensitive detector have been tested.

软x射线共振发射光谱是研究固体电子结构信息的有力方法之一。采用双晶单色仪选择同步辐射。用二次单色仪分析了样品的二次x射线发射光谱（荧光光谱）。然而，二次辐射强度普遍较弱，因此我们研制了新型高分辨率、高效率的光谱仪。为了实现高效率，我们研制了配备位置敏感探测器的弯晶光谱仪。我们设计了新的软x射线光谱仪。该光谱仪为Johann型弯曲晶体真空光谱仪，其中安装了曲率半径为100cm的弯曲晶体。原子面平行于表面的分析晶体被放置在与罗兰圆相切的圆上。位置敏感检测器与这个圆相切。利用硅靶的Si K_α发射光谱对该光谱仪进行了测试测量。本实验采用电子枪的3KV、80μA电子束作为激发源。对于Si K_α区，谱仪的分辨率约为0.5 eV。测试了三种类型的探测器，微通道板，电阻阳极气体比例计数器和步步高型位置敏感探测器。

项目成果

S.Nakai, et al.: "Resonant emission spectra of YF_3, YCL_3, Y_2O_2 and Y-metal in the YL_<III> absorption region"Phys.Rev.B. B61・11. 7433-7439 (2000)

S.Nakai等人：“YL_<III>吸收区域中的YF_3、YCL_3、Y_2O_2和Y-金属的共振发射光谱”Phys.Rev.B61·11（2000）。

S.Nakai, et al.: "Comparison between resonant L_α emission spectra and resonant LMM Auger spectra of Yttrium compounds"J.Synchrotron Rad.. 8・2. 401-403 (2001)

S.Nakai等人：“钇化合物的共振L_α发射光谱与共振LMM俄歇光谱的比较”J.Synchrotron Rad.. 8・2（2001）。

T.Kashiwakura, et al: "Electronic Structures of CeNi_2Al_5 and CeNiAl_4 Studied by Photoelectron Spectroscopy"J.Phys.Soc.Jpn.. 69・9. 3095-3099 (2000)

T.Kashiwakura等：“通过光电子能谱研究CeNi_2Al_5和CeNiAl_4的电子结构”J.Phys.Soc.Jpn.. 69・9(2000)。

T.Kasiwakura, et al.: "Electronic Structures of CeNi_2Al_5 and CeNiAl_4 Studied by Photoelectron Spectroscopy"J.Phys.Soc.Jpn.. 69・9. 3095-3099 (2000)

T. Kasiwakura等：“通过光电子能谱研究CeNi_2Al_5和CeNiAl_4的电子结构” J.Phys.Soc.Jpn.. 69・9 (2000)。

S.Nakai, et al: "Comparison between resonant L_α emission spectra and resonant LMM Auger spectra of Yttrium compounds"J.Synchrotron Rad.. 8・2. 401-403 (2001)

S.Nakai等：“钇化合物的共振L_α发射光谱与共振LMM俄歇光谱的比较”J.Synchrotron Rad.. 8・2（2001）。