Development of a nanometer scale spin polarized scanning electron microscope for surface magnetism
Development of a nanometer scale spin polarized scanning electron microscope for surface magnetism
批准号:
11440113
负责人:
MIZUNO Seigi
金额:
$9.09万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
1999
资助国家:
日本
项目状态:
已结题
起止时间:
1999 至 2001
中文摘要
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英文摘要
The goal of this research is to develop an apparatus for measurement of surface magnetism at nanometer-scale spatial resolution. The instrument consists of a scanning tunneling microscopy (STM) tip as a field emission gun, and a Mott detector for measuring the electron spin polarization.The following results have been obtained. (1) The operation of the tips under a field emission condition with bias voltages of 14 - 50 V has been established. The emission current was stable in the region from 0.1 nA to 1 nA. (2) The distances between the tip and the sample were measured while the bias voltage was changed, under a constant current mode. The results show that the distances strongly depend on the shape of the tip apex. A sharp tip apex is necessary to detect the scattered electrons. (3) The operation of the tips under a field emission condition with bias voltages of 14 - 50 V made it possible to detect the scattered electrons using a micro-channel plate. (4) A tip-shield has been proposed … More to improve extraction functions. The influence of the tip-shield was calculated using a simulation program and confirmed experimentally. The detection efficiency of the scattered electrons became remarkably large. (5) The possibility of nanometer-scale low-energy electron diffraction using STM tips has been demonstrated. (6) It has been confirmed that the tip-shield exerts no harmful influences on the resolution of the STM measurements. Atomic resolution has been achieved with the tip-shield on Si(111) and Si(001) surfaces. (7) A small-size Mott detector of good sensitivity has been developed using a fluorescent material.The full development of the apparatus has not been completed because the amount of scattered electrons is very low. Moreover, the field emission condition depends very strongly on the shape of the tip apex. However, the above results show the path for the development of the target instrument, and demonstrate a potential for the detection of the surface electron spin polarization at nanometer-scale resolution. Less
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S. Mizuno, J. Fukuda and H. Tochihara: "Extraction of scattered low-energy electrons in field emission conditions"Surface Science. (in press). (2002)
S. Mizuno、J. Fukuda 和 H. Tochihara:“场发射条件下散射低能电子的提取”表面科学。
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S.Mizuno: "Development of an advanced low-energy electron diffraction technique using field-emitted electrons from STM tips"J.Vacuum Science and Technology B. 19. 1874-1878 (2001)
S.Mizuno:“利用 STM 尖端的场发射电子开发先进的低能电子衍射技术”J.Vacuum Science and Technology B. 19. 1874-1878 (2001)
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作者:
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通讯作者:
S.Mizuno, J.Fukuda, H.Tochihara: "Extraction of scattered low-energy electrons in field emission condition"Surface Science. (in press). (2002)
S.Mizuno、J.Fukuda、H.Tochihara:“场发射条件下散射低能电子的提取”表面科学。
DOI:
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发表时间:
期刊:
影响因子:
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作者:
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通讯作者:
S.Mizuno: "Development of an advanced low-enregy electron diffraction technique using field-emitted electrons from STM tips"Journal of Vacuum Science and Technology B. 19. 1874-1878 (2001)
S.Mizuno:“利用 STM 尖端的场发射电子开发先进的低能电子衍射技术”Journal of Vacuum Science and Technology B.19. 1874-1878 (2001)
DOI:
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发表时间:
期刊:
影响因子:
--
作者:
[]
通讯作者:
S. Mizuno: "Development of an advanced low-energy electron diffraction technique using field-emitted electrons from STM tips"Journal of Vacuum Science and Technology B. 19. 1874-1878 (2001)
S. Mizuno:“利用 STM 尖端的场发射电子开发先进的低能电子衍射技术”真空科学与技术杂志 B. 19. 1874-1878 (2001)
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发表时间:
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影响因子:
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作者:
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通讯作者:
Determination of surface structures on silicon oxynitride layer and other layers grown on crystals
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批准号:20340077
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$12.4万
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财政年份:2008
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负责人:MIZUNO Seigi
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依托单位:
海外基金