Engineering Applications of Berry's Geometric Phase Information

Berry几何相位信息的工程应用

• 批准号: 11450027
• 负责人: TAKEDA Mitsuo
• 金额: $ 8.26万
• 依托单位: The University of Electro-Communications
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B).
• 财政年份: 1999
• 资助国家: 日本
• 起止时间: 1999 至 2000
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-11450027/
• 关键词: Berry Phase; Interferometric Microscope; 3-D Shape Measurement; Optical Metrology; Geometric Phase; Polarimetry; 3次元形状計測; 光応用計測; 偏光干渉計測; スピン・リダイレクション位相

The purpose of this research project is to exploit Berry's geometric phase information for engineering applications. A novel polarization interference microscope was developed that can visualize local surface inclinations of a microscopic object as a geometric phase image called a photon spin-redirection phase image. The main accomplishments are summarized in the following :1. Experimental Detection of Photon Spin-redirection PhasePhoton spin-redirection phase was detected by interferometry using circularly polarized light passing through non-planar optical paths, and its relation to the history of the beam propagation direction changes was experimentally clarified.2. Development of Efficient Algorithm and Its Computer Code for Evaluation of Berry's PhaseAn efficient algorithm and computer code were developed for unified analysis and evaluation of spin-redirection and Pancharatnam phases for a beam propagating in a complex optical system.3. Establishment of Technique for Separation of Berry Phase from Dynamical PhaseA new technique of differential polarization interferometry was developed that enables selective detection of Berry phase by eliminating dynamical phase.4. Construction and Experimental Demonstration of Berry Phase Interference MicroscopeAn experimental system was constructed and the validity of the proposed technique was demonstrated by visualizing Berry phase introduced by local surface inclinations of 3-D micro structures on a Si wafer.

本研究项目的目的是利用贝瑞的几何相位信息进行工程应用。研制了一种新型偏振干涉显微镜，可以将微观物体的局部表面倾角可视化为光子自旋重定向相位像。主要成果总结如下：1、研究成果。光子自旋重定向相位的实验检测利用圆偏振光通过非平面光路，采用干涉法检测了光子自旋重定向相位，并通过实验阐明了其与光束传播方向变化历史的关系。开发了一种有效的算法和计算机代码，用于统一分析和评估复杂光学系统中光束的自旋重定向和Pancharatnam相位。Berry相与动态相分离技术的建立本文提出了一种新的微分偏振干涉技术，通过消除动态相，实现了Berry相的选择性检测。构建了一个实验系统，通过对硅晶片上三维微结构的局部表面倾斜引入的Berry相进行可视化，验证了该技术的有效性。

项目成果

Alexander V.Tavrov: "Interferometric microimaging based on geometrical spin-redirection phase"Extended Abstracts, Optics Japan '99. 403-404 (1999)

Alexander V.Tavrov：“基于几何自旋重定向相位的干涉微成像”扩展摘要，日本光学 99。

A.V.Tavrov, Y.Miyamoto, T.Kawabata, M.Takeda, and V.V.Andreev: "Interferometric microimaging based on geometrical spin-redirection phase"Extended Abstrats, Optics Japan'99. 403-404 (1999)

A.V.Tavrov、Y.Miyamoto、T.Kawabata、M.Takeda 和 V.V.Andreev：“基于几何自旋重定向相位的干涉微成像”扩展摘要，Optics Japan99。

Alexander V.Tavrov: "Method to evaluate the geometrical spin-redirection phase for a nonplanar ray"Journal of the Optical Society of America. Vol.16 No.4. 919-921 (1999)

Alexander V.Tavrov：“评估非平面射线几何自旋重定向相位的方法”美国光学学会杂志。

A.V.Tavrov: "Visualization of Berry spin-redirection phase in polarization interferometer with geometric shear"Proc.SPIE. 4101. 12-20 (2000)

A.V.Tavrov：“具有几何剪切的偏振干涉仪中 Berry 自旋重定向相的可视化”Proc.SPIE。

A.Tavrov, Y.Miyamato, T.Kawabata, and M.Takeda: "Geometrical spin redirection phase : ray tracing and imaging"Extended Abstract, Optics Japan 2000. 127-128 (2000)

A.Tavrov、Y.Miyamato、T.Kawabata 和 M.Takeda：“几何自旋重定向阶段：射线追踪和成像”扩展摘要，Optics Japan 2000. 127-128 (2000)