Research of the new X-ray technique to measure an-incident X-ray photon position with sub-micron precision as well as its wave length

亚微米精度测量入射X射线光子位置及其波长的新型X射线技术研究

• 批准号: 13440062
• 负责人: TSUNAMI Hiroshi
• 金额: $ 9.41万
• 依托单位: Osaka University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B)
• 财政年份: 2001
• 资助国家: 日本
• 起止时间: 2001 至 2002
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-13440062/
• 关键词: X-ray CCD; Energy resolution; position resolution; Mesh experiment; charge cloud shape; CCD; 電子雲; 位置分解

Direct X-ray detecting CCDs show better energy resolution than that of a solid state detector and high position resolution. The position resolution is thought to be limited by the pixel size. We experimentally showed that it could achieve better position reslution than that of a pixel size by referring to the actual chargp spread inside the CCD. It is essential to directly measure the charge spread inside the CCD that can be measured by using a mesh technique. We have actually measured the charge spread generated by an X-ray photon as a function of energy. They are approximately represented by a Gaussian function. This is due to the fact that the charge spreads through diffusion process when it moves from the photo-absorbed location to the potential well.Generally speaking, a backilluminated CCD generates a more moderate size of charge spread than that by a front-illmninated CCD. We applied our method to improve the image puality of the Chandra ACIS, which enables us to improve the image quality limited by an X-ray mirror. We will apply our method in various fields in X-ray optics.

直接X射线探测器显示出比固体探测器更高的能量分辨率和更高的位置分辨率。位置分辨率被认为受到像素大小的限制。实验表明，与像素大小相比，通过参考实际电荷分布，该方法可以获得更好的位置分辨率。直接测量电荷耦合器件内部的电荷分布是非常必要的，这可以用网格技术来测量。我们实际上已经测量了X射线光子产生的电荷扩散作为能量的函数。它们近似地用一个高斯函数表示。这是由于电荷从光吸收位置移动到势垒时通过扩散过程扩散的结果，一般来说，背光的电荷散布比正面照射产生的电荷散布的大小要适中。我们将我们的方法应用于改善Chandra ACIS的图像质量，从而使我们能够改善受X射线镜限制的图像质量。我们将把我们的方法应用于X射线光学的各个领域。

项目成果

K.Mori: "Measurement of the response characteristics around K absorption edges of dead-layer materials of a charge-coupled device"Nuclear Instrument and Method. A459. 191-199 (2001)

K.Mori：“电荷耦合器件死层材料 K 吸收边缘周围响应特性的测量”核仪器和方法。

J.Hiraga: "Direct measurement of sub-pixel of the EPIC MOD CCD on-board the XMM/NEWTON satellite"Nuclear Instrument and Method. A465. 384-393 (2001)

J.Hiraga：“XMM/NEWTON 卫星上 EPIC MOD CCD 子像素的直接测量”核仪器和方法。

H.Tsunemi et al.: "Observation of Kes 27 : A Typical Mixed-Morphology SNR"Pub.Astr.Soc. Japan. 54. 229-234 (2002)

H.Tsunemi 等人：“Kes 27 的观察：典型的混合形态 SNR”Pub.Astr.Soc。

H.Tsunemi, J.Hiraga and E.Miyata: "Application of a finite size of the charge cloud shape generated by an X-ray photon inside the CCD"Nucl Instrum.and Meth. 155-160 (2002)

H.Tsunemi、J.Hiraga 和 E.Miyata：“CCD 内 X 射线光子生成的电荷云形状的有限尺寸的应用”Nucl Instrum.and Meth。

E.Miyata: "Reflection Shocked Gas in the Cygnus Loop Supernova Remnant"Astrophysical Journal. 552. 624-638 (2001)

E.Miyata：“天鹅座环超新星遗迹中的反射冲击气体”天体物理学杂志。