Research and Development of the Non-invasive Beam Diagnostics on High Quality Electron Beam Using Optical Diffraction Radiation
Research and Development of the Non-invasive Beam Diagnostics on High Quality Electron Beam Using Optical Diffraction Radiation
批准号:
15540301
负责人:
URAKAWA Junji
金额:
$1.98万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
2003
资助国家:
日本
项目状态:
已结题
起止时间:
2003 至 2004
中文摘要
在KEK加速器实验装置(KEK-ATF)上进行了一项研究狭缝靶的光学衍射辐射(ODR)的实验,作为一种可能的非侵入性电子束尺寸诊断工具。实验装置已安装在提取管路的诊断部分。我们首次从狭缝目标上进行了非相干ODR观测。测得的角分布与理论预期符合得很好。观察到了束流尺寸对ODR角方向图的影响。此外,还实现了对光束尺寸的灵敏度,最小为14μm。目标安装在45度。到光束的轨迹。目标是一块尺寸为7.9 mm的硅晶片,上面覆盖着黄金,以获得更好的反射率。该板有0.26x5mm2的矩形孔。由于靶子没有被完全切割,所以它的两半自然是共面的。由于目标是倾斜的,所以有效狭缝尺寸a=0.26Sin(45)=185μm。目标Thi…最大切割度为0.3 mm。我们的主要想法是,电子束必须完全不接触靶子。为此,缝隙边缘具有倾斜的形状。它使我们能够减小狭缝尺寸,增加ODR光子产额。我们的最终目标是测量单发光束的大小。为此,我们正在考虑一种新的基于图像增强型CCD相机的探测器系统。观测到来自上游弯曲磁体的巨大同步辐射(SR)背景。对于束流诊断来说,排除背景是极其必要的,因为它严重扭曲了ODR角模式。为此,我们在靶前安装了SR掩模,并切断了SR光子的主要部分,实现了对14μm光束尺寸的灵敏度。但我们假设存在系统误差,这可能是由SR光子的左侧部分引起的,即实验厅X射线背景。为了能够测量小于10μm的光束尺寸,我们必须了解并减小系统误差。显然,用光电倍增管进行的测量不是单次测量。但是,毫无疑问,这是实现最终目标的合理的第一步。较少
英文摘要
An experiment on investigation of optical diffraction radiation (ODR) from a slit target as a possible tool for non-invasive electron beam size diagnostics has been performed at KEK - Accelerator Test Facility (KEK-ATF). The experimental setup has been installed at the diagnostics section of the extraction line. We have performed the first incoherent ODR observation from a slit target. The measured angular distributions are in reasonable agreement with the theoretical expectation. The beam size effect onto the ODR angular pattern has been observed. Moreover, the sensitivity to the beam size as small as 14μm has been achieved. The target is mounted at 45 deg. to the beam trajectory. The target is a silicon wafer with 7.9mm dimensions covered with gold for better reflectivity. The plate has rectangular hole of 0.26x5mm2. As the target is not completely cut, two halves of it are naturally coplanar. Since the target is tilted, the effective slit size a =0.26 sin(45) = 185μm. The target thi … More ckness is 0.3mm. Our main idea is that the electron beam must not touch the target at all. For that purpose the slit edges have an oblique shape. It allowed us to reduce the slit size and increase the ODR photon yield.The our final goal is the single shot beam size measurements. To this purpose we are considering a new detector system based on an image intensified CCD camera. A huge synchrotron radiation (SR) background from the upstream bending magnet was observed. For beam diagnostics it was extremely necessary to reject the background, because it significantly distorted the ODR angular pattern. For that purpose we installed SR mask in front of the target and cut off the dominant part of the SR photons.We have achieved the sensitivity to the beam size as small as 14μm. However, we suppose that a systematic error exists, which might be caused by the left part of SR photons, experimental hall X-ray background. To be able to measure the beam size smaller than 10μm, we shall have to understand and reduce the systematic error. Obviously the measurements with the PMT are not single shot ones. But, undoubtedly that is the reasonable first step of the ultimate goal. Less
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Y.Honda et al.: "Achievement of Ultralow Emittance Beam in the Accelerator Test Facility Damping Ring"Physical Review Letters. 92. 054802-1-054802-5 (2004)
Y.Honda 等人:“加速器测试设施阻尼环中超低发射光束的实现”物理评论快报。
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Development of Optical Diffraction Radiation Beam Size Diagnostics at KEK Accelerator Test Facility
KEK 加速器测试设施光学衍射辐射束尺寸诊断的开发
DOI:
--
发表时间:
2004
期刊:
Proceedings of EPAC 2004,Lucerne, Switzerland EPAC2004
影响因子:
--
作者:
[P.Karataev, S.Araki, R.Hamatsu, H.Hayano, T.Muto, J.Urakawa et al., T.Muto et al., P.Karataev et al.]
通讯作者:
P.Karataev et al.
回折放射光による非破壊的ビーム診断
使用衍射同步加速器辐射进行无损束诊断
DOI:
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发表时间:
2003
期刊:
日本物理学会誌 58
影响因子:
--
作者:
[浦川順治, 浜津良輔, 武藤俊哉]
通讯作者:
武藤俊哉
浦川順治, 浜津良輔, 武藤俊哉: "回折放射光による非破壊的ビーム診断"日本物理学会誌. 58. 611-615 (2003)
Junji Urakawa、Ryosuke Hamatsu、Toshiya Muto:“使用衍射同步加速器辐射的无损光束诊断”日本物理学会杂志 58. 611-615 (2003)。
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浦川順治: "電子ビームの非破壊測定法"日本物理学会講演概要集. 59巻1号. 116-116 (2004)
Junji Urakawa:“电子束的无损测量方法”日本物理学会讲座摘要第59卷,第1. 116-116期(2004年)。
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共 11 条
measurement of ultra-high intensity average pulse power storage threshold
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批准号:24654076
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项目类别:Grant-in-Aid for Challenging Exploratory Research
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资助金额:$2.41万
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财政年份:2012
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负责人:URAKAWA Junji
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依托单位:
Research for Hybrid System comprised Laser Super Cavity and Off-Axis Parabolic Reflective mirrors toward International Linear Collider
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批准号:17GS0210
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项目类别:Grant-in-Aid for Creative Scientific Research
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资助金额:$253.34万
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财政年份:2005
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负责人:URAKAWA Junji
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依托单位: