Analytic Field Emission Scanning Electron Microscope with Soft X-ray and Raman Spectrometer

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At RWTH Aachen, high resolution scanning electron microscopy (SEM) is an indispensable method for extensive characterization of novel materials with respect to morphology, chemical and crystallographic microstructure. Scanning electron microscopes already installed at RWTH Aachen cannot cover the needs for characterizing energy materials, in particular concerning lithium as a low mass element and composites of inorganic and organic materials. Therefore, a state-of-the-art field emission SEM equipped with a detector for soft X-rays and a Raman spectrometer is requested.