Analytic Field Emission Scanning Electron Microscope with Soft X-ray and Raman Spectrometer

配备软 X 射线和拉曼光谱仪的分析场发射扫描电子显微镜

• 批准号: 464867041
• 金额: --
• 依托单位: Rheinisch-Westfälische Technische Hochschule Aachen
• 依托单位国家: 德国
• 项目类别: Major Research Instrumentation
• 财政年份: 2021
• 资助国家: 德国
• 起止时间: 2020-12-31 至 无数据
• 项目状态: 未结题
• 来源: https://gepris.dfg.de/gepris/projekt/464867041?language=en
• 关键词: Analytic; Field; Emission; Scanning; Electron

At RWTH Aachen, high resolution scanning electron microscopy (SEM) is an indispensable method for extensive characterization of novel materials with respect to morphology, chemical and crystallographic microstructure. Scanning electron microscopes already installed at RWTH Aachen cannot cover the needs for characterizing energy materials, in particular concerning lithium as a low mass element and composites of inorganic and organic materials. Therefore, a state-of-the-art field emission SEM equipped with a detector for soft X-rays and a Raman spectrometer is requested.

在RWTH ACHEN，高分辨率扫描电子显微镜（SEM）是一种必不可少的方法，用于在形态，化学和晶体学微观结构方面广泛表征新型材料。已经安装在RWTH AACHEN的扫描电子显微镜不能满足表征能量材料的需求，特别是将锂作为低质量元素和无机和有机材料的复合材料。因此，请求使用配备软X射线的检测器和拉曼光谱仪的最先进的场发射SEM。