300kV Cs-corrected transmission electron microscope

300kV CS校正透射电子显微镜

• 批准号: 466823680
• 金额: --
• 依托单位: Technische Universität Chemnitz
• 依托单位国家: 德国
• 项目类别: Major Research Instrumentation
• 财政年份: 2022
• 资助国家: 德国
• 起止时间: 2021-12-31 至 无数据
• 项目状态: 未结题
• 来源: https://gepris.dfg.de/gepris/projekt/466823680?language=en
• 关键词: 300kV; Cs; corrected; transmission; electron

The requested scanning transmission electron microscope (STEM) with a monochromatized electron beam is a microscope with highest resolution. Based on the corrected spherical aberration, structural and analytical investigations with subatomic resolution are feasible and the instrument will be used mainly in the area of solid state-based fundamental research. Various detectors (ABF, HAADF, DPC, etc.) for bright and dark field imaging allow within the STEM mode the determination of the elemental composition, details of the crystal structure (4DSTEM) as well as electric fields on the atomic scale. By means of EDX and EELS (together with a low-dose option), detailed and reliable studies of the chemical elements, their binding states and the electronic structure as well as electronic excitations in complex materials and (sensitive) nanostructures, which play a central role in engineering and natural sciences at the TU Chemnitz, are envisaged. The instrument configuration is optimized with regard to highest resolution, best possible detection sensitivity of the integrated analysis systems (EDX, EELS), the working possibilities with sensitive samples as well as the complex data acquisition when scanning over sample areas (4DSTEM).

所要求的扫描透射电子显微镜（STEM）具有单色化电子束，是具有最高分辨率的显微镜。基于校正的球差，亚原子分辨率的结构和分析研究是可行的，该仪器将主要用于基于固态的基础研究领域。各种探测器（ABF、HAADF、DPC等）用于明场和暗场成像的4DSTEM允许在STEM模式内确定元素组成、晶体结构的细节（4DSTEM）以及原子尺度上的电场。通过EDX和EELS（以及低剂量选项），可以对化学元素，其结合状态和电子结构以及复杂材料和（敏感）纳米结构中的电子激发进行详细和可靠的研究，这些研究在切姆尼茨理工大学的工程和自然科学中发挥着核心作用。仪器配置在最高分辨率、集成分析系统（EDX、EELS）的最佳检测灵敏度、敏感样品的工作可能性以及扫描样品区域（4DSTEM）时的复杂数据采集方面进行了优化。