300kV Cs-corrected transmission electron microscope

300kV CS校正透射电子显微镜

• 批准号: 466823680
• 金额: --
• 依托单位: Technische Universität Chemnitz
• 依托单位国家: 德国
• 项目类别: Major Research Instrumentation
• 财政年份: 2022
• 资助国家: 德国
• 起止时间: 2021-12-31 至 无数据
• 项目状态: 未结题
• 来源: https://gepris.dfg.de/gepris/projekt/466823680?language=en
• 关键词: 300kV; Cs; corrected; transmission; electron

The requested scanning transmission electron microscope (STEM) with a monochromatized electron beam is a microscope with highest resolution. Based on the corrected spherical aberration, structural and analytical investigations with subatomic resolution are feasible and the instrument will be used mainly in the area of solid state-based fundamental research. Various detectors (ABF, HAADF, DPC, etc.) for bright and dark field imaging allow within the STEM mode the determination of the elemental composition, details of the crystal structure (4DSTEM) as well as electric fields on the atomic scale. By means of EDX and EELS (together with a low-dose option), detailed and reliable studies of the chemical elements, their binding states and the electronic structure as well as electronic excitations in complex materials and (sensitive) nanostructures, which play a central role in engineering and natural sciences at the TU Chemnitz, are envisaged. The instrument configuration is optimized with regard to highest resolution, best possible detection sensitivity of the integrated analysis systems (EDX, EELS), the working possibilities with sensitive samples as well as the complex data acquisition when scanning over sample areas (4DSTEM).

带有单色电子束的请求的扫描透射电子显微镜（Stem）是具有最高分辨率的显微镜。基于校正的球形畸变，具有亚原子分辨率的结构和分析研究是可行的，该仪器将主要用于基于固态的基础研究领域。各种检测器（ABF，HAADF，DPC等）用于明亮的暗场成像，允许在茎模式内确定元素组成，晶体结构（4DSTEM）的细节以及原子尺度上的电场。通过EDX和EEL（以及低剂量的选项），对化学元素，它们的结合状态和电子结构以及复杂材料和（敏感）纳米结构的电子激发的详细和可靠研究，这些元素在Tu Chemnitz的工程和自然科学中起着核心作用。在最高分辨率，综合分析系统（EDX，EELS），具有敏感样本的工作可能性以及对样品区域（4DSTEM）扫描时的复杂数据采集（4DSTEM）时，仪器配置进行了优化。