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Direct orientation of liquid crystal molecule by AFM nano-rubbing and its application to optical devices

AFM纳米摩擦液晶分子直接取向及其在光学器件中的应用

基本信息

批准号：
16510097
负责人：
UMEDA Norihiro
金额：
$ 2.43万
依托单位：
National University Corporation Tokyo University of Agriculture and Technology
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (C)
财政年份：
2004
资助国家：
日本
起止时间：
2004 至 2005
项目状态：
已结题

项目摘要

The orientation control of liquid crystal (LC) molecule on the polyimide film has been necessary to fabricate LC devices. Nano-rubbing by atomic force microscope (AFM) has been proposed as the one of methods to control it precisely. In the method, a thin polyimide film was rubbed by a sharpened AFM probe-tip with relatively strong load force. However, the method has some drawbacks ; the frictional wear of AFM probe-tip and the difficulty of reorientation after rubbing. In this paper, we have proposed the orientation control of LC on the polyimide film and using direct AFM nano-rubbing method with weak load forces. The change of LC alignment was quantitatively observed by a polarization microscope and birefringence-contrast scanning near-field optical microscope. The effect of scanning density was strong for azimuth angle but the effect of the scanning velocity was weak for both retardation and azimuth angle. An optical switching device was developed utilized isotropic-nematic phase change of liquid crystal which was rubbed in the grating pattern with methyl red dying, and the optical device was operated at the frequency of 0.5Hz. As a result, The proposed method had an effective method to fabricate novel liquid crystal optical devices.

液晶分子在聚酰亚胺薄膜上的取向控制是制备液晶器件的必要条件。利用原子力显微镜（AFM）进行纳米级摩擦加工是实现纳米级摩擦加工精确控制的方法之一。在该方法中，聚酰亚胺薄膜摩擦的尖锐的原子力显微镜探针针尖与相对较强的负载力。但是，该方法也存在一些缺点，如探针针尖的摩擦磨损和摩擦后的重定向困难。在本文中，我们提出了液晶取向控制的聚酰亚胺薄膜和使用直接AFM纳米摩擦的方法与弱负载力。通过偏光显微镜和双折射-对比扫描近场光学显微镜定量观察了液晶取向的变化。扫描密度对方位角的影响较大，而扫描速度对相位差和方位角的影响较小。研制了一种利用液晶在甲基红染色的光栅图案中摩擦产生各向同性相变的光开关器件，工作频率为0.5Hz。该方法为制备新型液晶光学器件提供了一种有效的方法。

项目成果

期刊论文数量（17）

专著数量（0）

科研奖励数量（0）

会议论文数量（0）

专利数量（0）

Direct alignment of nematic liquid crystal molecule using atomic force microscope nano-rubbing

利用原子力显微镜纳米摩擦直接排列向列液晶分子

DOI：
发表时间：
2005
期刊：
Proceedings of SPIE 6050
影响因子：
0
作者：
Itaru Nishiyama;Norio Yoshida;Mizue Ebisawa;Atsuo Takayanagi;Yukitoshi Otani;Norihiro Umeda
通讯作者：
Norihiro Umeda

膜厚測定装置及び膜厚測定方法

膜厚测定装置及膜厚测定方法