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Analysis of Basic Phenomena on Tracking Resistance Test in Plastic.

塑料耐漏电起痕试验基本现象分析。

基本信息

批准号：
61550202
负责人：
KAWAMURA Koin
金额：
$ 1.09万
依托单位：
Akita University
依托单位国家：
日本
项目类别：
Grant-in-Aid for General Scientific Research (C)
财政年份：
1986
资助国家：
日本
起止时间：
1986 至 1987
项目状态：
已结题

项目摘要

The purpose of the investigation is to analyze the correlation between the tracking resistance to tracking and the noise which is piled up on the fundamental wave(AC 240 V) using a test method similar to the IEC tracking test. On the basis of these experimental results, the mechanisma and processes of tracking failure, The effects of noise on the comparative tracking indices(CTI) and the scatter of data were discussed. The results can be summarized as follows. (1) The CTI by applying of the intermittent AC voltage was smaller than that by applying of the continuous AC voltage. The resistance to tracking was accelerated by the noise. (2) For the noise voltage of having a 90゜ phase applied, the tracking failure was accelerated as the noise value increased within the value was 1kV. Any further incresed in the noise voltage, the number of drops to tracking failure incresed, and the standard deviation became large. (3) The scintillations occurred within the noise value was 1 kV, while the glow discharges occurred over 1.3 kV. (4) The tracking failure was accelarated by the heat of scintillation. On the other hand, the glow discharges did not take part in the tracking failure. (5) In the case of the noise voltage of having a 30゜ phase, the number of drops to tracking failure decreased in the noise value of 0.9 kV, and the scatter became constant. (6) When the noise voltage was 0.5 kV and the phases were varied, the number of drops to tracking failure depended on the phase, and the tracking failure was accelerated by the positive noise on the fundamental wave. On the other hand, the number of drops incresed at the test condition of the negative noise voltage of having 270゜ phase.

本研究的目的是使用与IEC跟踪测试类似的测试方法，分析跟踪电阻与基波（AC 240 V）上堆积的噪声之间的相关性。在此基础上，讨论了跟踪失败的机理和过程，噪声对比较跟踪指数（CTI）的影响以及数据的分散性。结果可归纳如下。(1)通过施加间歇AC电压的CTI小于通过施加连续AC电压的CTI。噪音加速了对跟踪的抵抗。(2)对于施加90 Ω相位的噪声电压，在1kV的值内，随着噪声值的增加，跟踪故障加速。噪声电压的任何进一步增加，到跟踪故障的下降的数量增加，并且标准偏差变大。(3)在噪声值为1 kV时发生放电，而在1.3 kV以上时发生辉光放电。(4)闪烁热加速了跟踪失败。另一方面，辉光放电没有参与跟踪故障。(5)在具有30 kV相位的噪声电压的情况下，在0.9kV的噪声值中，到跟踪故障的下降的数量减少，并且分散变得恒定。(6)当噪声电压为0.5 kV且相位变化时，跟踪失败的下降次数取决于相位，并且基波上的正噪声加速了跟踪失败。另一方面，在具有270 Ω相位的负噪声电压的测试条件下，液滴的数量增加。