Development of Dynamic Measuring System for Molecular Orientation Process with Total Reflection X-Ray Diffraction Method

全反射X射线衍射法分子取向过程动态测量系统的研制

• 批准号: 01850009
• 负责人: MATSUSHIGE Kazumi
• 金额: $ 2.82万
• 依托单位: Kyushu University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Developmental Scientific Research (B).
• 财政年份: 1989
• 资助国家: 日本
• 起止时间: 1989 至 1990
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-01850009/
• 关键词: Total reflection X-ray; Ultra-thin films; Molecular orientation; Vacuum evaporation; Structural control; Organic molecule; Dynamic measurement; Structural evaluation; 有機物質; 真空蒸着; X線全反射; 相転移; 温度変化

The objectives of this study were to develop the system capable of analyzing the molecular orientations on substrates during a vacuum evaporation process in order to establish the method to control the molecular structures in ultra-thin organic films. Major results are as follows.1) Total X-ray diffraction method was revealed to provide the structural informations about molecular orientation as well as crystal structures of ultra-thin organic films as thin as 100 A.2) Vacuum evaporated normal paraffin films undertook the phase transition similarly to the bulk samples upon a heating process, and showed the alternation of molecular orientation from parallel to vertical directions to the surface of the substrate.3) The structural control by the application of electric fields during the evaporation process was tried for two polar polymers of PVDF and (VDF/TrFE) copolymers. The films thus prepared exhibited the polar crystal structures and piezo- and pyro-electric activities.4) The in-situ measuring system was constructed to analyze the molecular structure under an evaporating process by combining the total X-ray diffraction measuring system and the vacuum evaporation instrument, and its performance was fully ascertained to become a powerful method.

本研究的目的是开发一套能够分析真空蒸发过程中基片上分子取向的系统，以建立控制超薄有机薄膜中分子结构的方法。主要结果如下：1）全X射线衍射法可以提供100埃以下超薄有机薄膜的分子取向和晶体结构信息。2）真空蒸发正构烷烃薄膜在加热过程中发生了与体相类似的相变，并显示出分子取向的交替，从平行于基底表面的方向到垂直方向。3）在蒸发过程中施加电场的结构控制尝试了PVDF和（VDF/TrFE）共聚物的两种极性聚合物。4）将全X射线衍射测量系统与真空蒸发仪相结合，构建了蒸发过程中分子结构的原位测量系统，并对其性能进行了充分的验证，使其成为一种强有力的分析手段。

项目成果

K.Fukao,T.Horiuchi,K.Matsushige: "Observation of Molecular Orientation in Evaporated Films of n-Paraffins" Thin Solid Films. 171. 359-366 (1989)

K.Fukao、T.Horiuchi、K.Matsushige：“正构烷烃蒸发膜中分子取向的观察”固体薄膜。

T.Horiuchi,H.Kawamoto,K.Matsushige,K.Takehara,K.Isomura,H.Taniguchi: "Evaluation of Molecular Orientations in Evaporated Polarーorganic Thin Films by Energy Dispersive Xーray Diffractometer" Rept.Progr.Polym.Phys.Jpn.32. 153-156 (1989)

T.Horiuchi、H.Kawamoto、K.Matsushige、K.Takehara、K.Isomura、H.Taniguchi：“通过能量色散 X 射线衍射仪评估蒸发极性有机薄膜中的分子取向”Rept.Progr.Polym。物理学.Jpn.32。153-156 (1989)

Y.Yoshida,H.Kawamoto,T.Horiuchi,K.Matsushige: "Molecular Orientation of PVDF Films Evaporated under Electric Field" Rept.Progr.Polym.Phys.Jpn.33. 191-194 (1990)

Y.Yoshida、H.Kawamoto、T.Horiuchi、K.Matsushige：“电场下蒸发的 PVDF 薄膜的分子取向”Rept.Progr.Polym.Phys.Jpn.33。

K. Fukao, T. Horiuchi, K. Matsushige: "Observation of Molecular Orientation in Evaporated Films of n-Paraffins" Thin Solid Films. Vol. 171. 359-366 (1989)

K. Fukao、T. Horiuchi、K. Matsushige：“正构烷烃蒸发膜中分子取向的观察”固体薄膜。

堀内 俊寿,松重 和美: "エネルギ-分散型全反射X線回折計の開発と有機蒸着薄膜への応用" 理学電機ジャ-ナル. 21. 19-26 (1990)

Toshihisa Horiuchi、Kazumi Matsushige：“能量色散全内反射 X 射线衍射仪的开发及其在有机气相沉积薄膜中的应用”Rigaku Denki Journal 21. 19-26 (1990)。