Development of Dynamic Measuring System for Molecular Orientation Process with Total Reflection X-Ray Diffraction Method

本研究的目的是开发能够分析真空蒸发过程中衬底分子取向的系统，以建立控制超薄有机薄膜分子结构的方法。主要结果如下。1)采用全x射线衍射法获得了薄至100 a的超薄有机薄膜的分子取向和晶体结构信息。2)真空蒸发的正态石蜡薄膜在加热过程中发生了与本体样品相似的相变，并表现出分子取向从平行方向到垂直方向在衬底表面的变化。3)对两种极性聚合物PVDF和（VDF/TrFE）共聚物进行了蒸发过程中电场作用的结构控制试验。所制备的薄膜具有极性晶体结构和压电、热电活性。4)将全x射线衍射测量系统与真空蒸发仪相结合，构建了分析蒸发过程中分子结构的原位测量系统，充分确定了其性能，成为一种有力的方法。

The objectives of this study were to develop the system capable of analyzing the molecular orientations on substrates during a vacuum evaporation process in order to establish the method to control the molecular structures in ultra-thin organic films. Major results are as follows.1) Total X-ray diffraction method was revealed to provide the structural informations about molecular orientation as well as crystal structures of ultra-thin organic films as thin as 100 A.2) Vacuum evaporated normal paraffin films undertook the phase transition similarly to the bulk samples upon a heating process, and showed the alternation of molecular orientation from parallel to vertical directions to the surface of the substrate.3) The structural control by the application of electric fields during the evaporation process was tried for two polar polymers of PVDF and (VDF/TrFE) copolymers. The films thus prepared exhibited the polar crystal structures and piezo- and pyro-electric activities.4) The in-situ measuring system was constructed to analyze the molecular structure under an evaporating process by combining the total X-ray diffraction measuring system and the vacuum evaporation instrument, and its performance was fully ascertained to become a powerful method.