Developments of Surface Characterization System using White X-rays

白光X射线表面表征系统的开发

基本信息

  • 批准号:
    13355014
  • 负责人:
  • 金额:
    $ 25.54万
  • 依托单位:
  • 依托单位国家:
    日本
  • 项目类别:
    Grant-in-Aid for Scientific Research (A)
  • 财政年份:
    2001
  • 资助国家:
    日本
  • 起止时间:
    2001 至 2002
  • 项目状态:
    已结题

项目摘要

In order to a characterize surface structures under special environments, which cannot apply LEED and RHEED, an energy dispersive total infection X-ray analysis (ED-TRXA) system using white X-rays was developed, and applied this equipment to the surface and thin film analysis under the organic gas, under ultraviolet irradiation, etc. First, reflection-transmission type X-ray filter, consisted of the high electron density thin film(Au) and low attenuation coefficient substance (Be sheet and ultra-thin Si water), was proposed and fabricated for developing energy dispersive X-ray reflectivity (ED-XR) measurement technique using white x-rays. We succeed in fabricating high performance X-ray filter with hand-pans function. By utilizing the hand-pass X-ray filter to the ED-XR measurements, dynamic range of XR detection was increased with 1-2order. In addition, the surface structures of photocatalyst TiO_2 were investigated in several kinds of organic vapor (H_2O, CH_3OH, C_2H_5IH and C_3H_6OH) to demonstrate the performances of ED-TRXA system. In-plane diffraction peaks of TiO_2 crystal surface in organic and ultraviolet irradiation invested the displacements of surface lattice depending on the kind of organic vapor. Especially, surface structures on TiO_2(110) was greatly changed under the methyl alcohol, and this result was suggested high photo-catalytic activities of TiO_2(110) plane. Another application of ED-TRXA wan structural and orientational characterization of organic thin films with nm-thickness, and surface density estimations by using X-ray surface propagation wave. From these results obtained this period, it was suggested the ED-TRXA using white x-rays is useful and powerful tool for surface analysis under the special environment.
为了对不能应用LEED和RHEED的特殊环境下的表面结构进行表征,研制了一种利用白色x射线的能量色散全感染x射线分析(ED-TRXA)系统,并将该设备应用于有机气体、紫外线照射等条件下的表面和薄膜分析。首先,提出并制作了由高电子密度薄膜(Au)和低衰减系数物质(Be片和超薄Si水)组成的反射透射型x射线滤光片,用于开发白光射线能量色散x射线反射率(ED-XR)测量技术。我们成功地制造了具有手摇功能的高性能x射线滤光片。将手通x射线滤波器应用于ED-XR测量,使XR检测的动态范围提高了1-2个数量级。此外,还研究了光催化剂TiO_2在几种有机蒸汽(H_2O、CH_3OH、C_2H_5IH和C_3H_6OH)中的表面结构,以验证ED-TRXA体系的性能。有机和紫外光照射下TiO_2晶体表面的面内衍射峰对表面晶格位移的影响取决于有机蒸汽的种类。特别是在甲醇作用下,TiO_2(110)表面结构发生了很大的变化,这表明TiO_2(110)平面具有较高的光催化活性。ED-TRXA的另一个应用是纳米厚度有机薄膜的结构和取向表征,以及利用x射线表面传播波估计表面密度。从这段时间得到的这些结果表明,使用白色x射线的ED-TRXA是在特殊环境下进行表面分析的有用而有力的工具。

项目成果

期刊论文数量(30)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
K.EL-Hami: "Structural analysis of the P (VDF/TrFE) copolymer film"Chem.Eng.Sci.. 58. 397-400 (2003)
K.EL-Hami:《P(VDF/TrFE)共聚物薄膜的结构分析》Chem.Eng.Sci.. 58. 397-400 (2003)
  • DOI:
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  • 影响因子:
    0
  • 作者:
  • 通讯作者:
K.Noda et al.: "Molecular Ferroelectricity of Vinylidene Fluoride oligomer Investigated by Atomic Force Microscopy"Japanese Journal of Applied Physics. Vol.40. 4361-4364 (2001)
K.Noda等人:“通过原子力显微镜研究偏二氟乙烯低聚物的分子铁电性”日本应用物理学杂志。
  • DOI:
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    0
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  • 通讯作者:
K.Noda et al.: "Investigation Of Ferroelectric Properties Of Vinylidene Fluoride Oligomer Evaporated Films"Material Research Society Proceedings. Vol.748 (in-press). (2003)
K.Noda 等人:“偏二氟乙烯低聚物蒸发薄膜的铁电性质的研究”材料研究学会论文集。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
籠 恵太郎: "エネルギー分散型X反射率測定用屈折透過型X線フィルターの試作と有用性について"KEK Proceedings 2001. Vol.25. 61-62 (2001)
Keitaro Kago:“用于能量色散 X 反射测量的折射透射 X 射线滤光片的原型和用途”KEK Proceedings 2001。第 25 卷(2001 年)。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
Keiichi Umeda: "Surface Potential Measurement of Oligothiophene Ultrathin Films by Kelvin Probe Force Microscopy"Jpn. J. Appl Phys.. Vol.40, No.6B. 4381-4383 (2001)
Keiichi Umeda:“通过开尔文探针力显微镜测量低聚噻吩超薄膜的表面电位”Jpn。
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    0
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MATSUSHIGE Kazumi其他文献

MATSUSHIGE Kazumi的其他文献

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{{ truncateString('MATSUSHIGE Kazumi', 18)}}的其他基金

Carrier Accumulation Control in Semiconductors and Nonvolatile Memory Application with Organic Ferroelectric Dipoles
有机铁电偶极子在半导体和非易失性存储器应用中的载流子累积控制
  • 批准号:
    18206033
  • 财政年份:
    2006
  • 资助金额:
    $ 25.54万
  • 项目类别:
    Grant-in-Aid for Scientific Research (A)
Investigations and Control of Electronic Properties in a Small Number of Molecules
少量分子电子特性的研究和控制
  • 批准号:
    10305004
  • 财政年份:
    1998
  • 资助金额:
    $ 25.54万
  • 项目类别:
    Grant-in-Aid for Scientific Research (A)
Photo-Physical Measurements of Fuctional Organic Materials under High Pressure
高压下功能有机材料的光物理测量
  • 批准号:
    01460083
  • 财政年份:
    1989
  • 资助金额:
    $ 25.54万
  • 项目类别:
    Grant-in-Aid for General Scientific Research (B)
Development of Dynamic Measuring System for Molecular Orientation Process with Total Reflection X-Ray Diffraction Method
全反射X射线衍射法分子取向过程动态测量系统的研制
  • 批准号:
    01850009
  • 财政年份:
    1989
  • 资助金额:
    $ 25.54万
  • 项目类别:
    Grant-in-Aid for Developmental Scientific Research (B).
Development of Focus-type Ultrasonic Spectroscopy System Using Polymeric Piezoelectric Films
聚合物压电薄膜聚焦式超声光谱系统的研制
  • 批准号:
    62850007
  • 财政年份:
    1987
  • 资助金额:
    $ 25.54万
  • 项目类别:
    Grant-in-Aid for Developmental Scientific Research
Research on Photoconductivity of Polymers under High Pressure
高压下聚合物光电导性研究
  • 批准号:
    60550631
  • 财政年份:
    1985
  • 资助金额:
    $ 25.54万
  • 项目类别:
    Grant-in-Aid for General Scientific Research (C)

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Non-invasive prediction of blood lipid concentrations by mid-infrared attenuated total reflection measurement on the body surface
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    519331-2018
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    2020
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使用全反射高能正电子衍射对光激发二氧化钛表面进行结构分析
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全反射高能正电子衍射测定Si(111)7x7重构表面的原子坐标
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