300 keVTransmission electron microscope (TEM)

300 keV 透射电子显微镜 (TEM)

• 批准号: 524736584
• 金额: --
• 依托单位: Laboratorium für Elektronenmikroskopie (LEM)
• 依托单位国家: 德国
• 项目类别: Major Research Instrumentation
• 财政年份: 2023
• 资助国家: 德国
• 起止时间: 2022-12-31 至 无数据
• 项目状态: 未结题
• 来源: https://gepris.dfg.de/gepris/projekt/524736584?language=en
• 关键词: 300; keVTransmission; electron; microscope; TEM

We apply for a state-of-the-art analytical high-resolution scanning / transmission electron microscope, for the nanoscale structural and chemical characterization of beam sensitive and high-performance materials. It is required for the investigation of elementary mechanisms which govern the formation and evolution of nano and microstructures in functional and structural materials. A sound understanding of these processes characterizes materials research in different fields including chemistry, physics, nano technology and engineering materials science. The different research communities focus on different materials with specific properties. But all research efforts have in common that atomic scale features (position, chemical nature and electronic properties of atoms) govern the formation and evolution of nano- and microstructure which in turn define the material properties on the macro scale. In crystalline materials point defects (vacancies and impurities), linear defects (dislocations), planar defects (internal and external interfaces) and 3D defects (such as pores, inclusions and nanoparticles) are important. These defects are viewed as the critical elements of nano- and microstructures. The new instrument will give a scientific boost to KIT material projects (running, approved and planned), in particular to collaborative research activities (clusters of excellence, collaborative research centers, graduate school) where there is a need to apply high level analytical electron microscopy. The new AHR-S/TEM is needed to analyze nano- and microstructures. In its high-resolution mode, it will allow to access atomic level information (atom positions, electronic structure of atoms) as well as local chemistry on the nano scale. The new microscope will be able to characterize all materials, also beam sensitive ones. State of the art AHR-S/TEMs are equipped with a field emission gun (which provides high energy electrons with little scatter in electron energy) and a monochromator (which allows to filter electron energies). They possess corrector devices (which allow to overcome spherical aberrations ) and analytical spectrometers (which allow for efficient local chemical and electronic property assessment). They feature a sensitive and fast detection hardware which allows to monitor high-speed material evolution processes upon applying external stimuli in structural engineering materials, chemical catalysts and in all kinds of electron beam sensitive materials. Today’s AHR-S/TEMs represent integrated systems which allow to directly observe dynamic processes on the nanoscale (in situ methods) and to determine crystallographic textures (nano and micro scale). Most importantly, the AHR-S/TEMs must run with a software environment, which allows to effectively combine sequences of analysis steps, to digitally organize procedures and document data and metadata and to operate the instrument under remote control.

我们申请了一台最先进的分析型高分辨率扫描/透射电子显微镜，用于对光束敏感和高性能材料进行纳米级结构和化学表征。这是需要的基本机制，控制功能和结构材料中的纳米和微米结构的形成和演变的调查。对这些过程的充分理解是不同领域材料研究的特征，包括化学，物理，纳米技术和工程材料科学。不同的研究团体专注于具有特定特性的不同材料。但所有的研究工作都有一个共同点，即原子尺度特征（原子的位置、化学性质和电子性质）决定了纳米和微观结构的形成和演变，而纳米和微观结构又决定了宏观尺度上的材料性质。在晶体材料中，点缺陷（空位和杂质）、线性缺陷（位错）、平面缺陷（内部和外部界面）和3D缺陷（如孔隙、夹杂物和纳米颗粒）是重要的。这些缺陷被认为是纳米和微米结构的关键元素。新仪器将为KIT材料项目（运行，批准和计划）提供科学推动，特别是需要应用高水平分析电子显微镜的合作研究活动（卓越集群，合作研究中心，研究生院）。需要新的AHR-S/TEM来分析纳米和微观结构。在其高分辨率模式下，它将允许访问原子级信息（原子位置，原子的电子结构）以及纳米尺度上的局部化学。新的显微镜将能够表征所有材料，也包括光束敏感材料。最先进的AHR-S/TEM配备有场发射枪（其提供高能电子，电子能量几乎没有散射）和单色器（其允许过滤电子能量）。他们拥有校正装置（允许克服球面像差）和分析光谱仪（允许有效的局部化学和电子特性评估）。它们具有灵敏和快速的检测硬件，可以在结构工程材料、化学催化剂和各种电子束敏感材料中施加外部刺激时监测高速材料演化过程。今天的AHR-S/TEM代表了集成系统，可以直接观察纳米级的动态过程（原位方法），并确定晶体结构（纳米和微米尺度）。最重要的是，AHR-S/TEM必须在软件环境下运行，这允许有效地联合收割机组合分析步骤序列，以数字方式组织程序和文档数据和元数据，并在远程控制下操作仪器。