Research on Chemical and Physical Characterization for Electrical Properties of Nonlinear Optical Thin Films

用X射线衍射仪研究了在1 ton/cm ^2压力下制备的VOPc片和在Tp：200 ℃，Ts：200 ℃，te：190 min条件下用分子束外延法制备的VOPc薄膜的取向。在1 ton/cm ^2压力下压制的VOPc片的X射线衍射图显示出沿沿着有许多衍射峰。这意味着以1吨/平方厘米压制的VOPc板形成有许多随机取向。从这些数据中可以明显看出，在MBE法制备的VOPc薄膜中，存在两个在白云母基质的X射线衍射谱中未观察到的峰。这意味着VOPc分子之间的距离估计为3 A和3.8 A。VOPc分子是具有三角形结构的平面分子，其中14 A作为基线长度。这表明VOPc薄膜中的每个分子都平行于衬底取向。这些结果支持了VOPc薄膜/白云母界面间存在强相互作用的ESCA观察结果，并对白云母表面存在两种平行取向的现象进行了详细的解释。

The orientations of the VOPc plate pressed at 1ton/cm^2 and VOPc thin film produced under Tp : 200ﾟC,Ts : 200ﾟC and te : 190 min by MBE method were investigated by X-ray diffraction. The X-ray diffraction pattern of the VOPc plate pressed at 1ton/cm^2 shows a lot of peaks along diffraction angle. This means that the VOPc plate pressed at 1ton/cm^2 is formed with many random orientation. In the VOPc thin film produced by MBE method, two peaks which are not observed in the X-ray diffraction spectrum for the muscovite subsutrate, markedly exist from these data. This means that the distances between VOPc molecules are estimated as 3 A and 3.8 A.The VOPc molecule is a plane molecule having a triangular structure with 14A as a base line length. These indicate that each molecule in the VOPc thin film is oriented in parallel to the substrate. These results support the existence of strong interaction between VOPc thin film/muscovite interface observed by ESCA.Detailed explanation for the existence of two kinds of parallel orientation on the muscovite is under investigation.