Development of cluster/ultra-fine-particle analyzer by deflection mass spectroscopy

点击翻译按钮获取中文摘要

In order to investigate a mechanism of nanometer particle generation, a cluster/ultra-fine-particle analyzer by using deflection mass spectroscopy was developed. The ultra fine particles generating from copper rod by laser abrasion was used as samples. The sample particles were observed by scanning electron microscopy and there were distributed from 2nm to 20 nm. The developed analyzer could be measured more than 5 nm particles and it was found that 50 % (weight) of sample particles were aggregated 4 pieces of 5 nm primary particle. The shapes of particles generating from laser abrasion were affected by laser pulse mode.