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Reliability of the Traditional Analyzes of Polymer Structures? Investigation through the Development of High-Performance Electron Diffraction System

聚合物结构传统分析的可靠性？

基本信息

批准号：
07555605
负责人：
TASHIRO Kohji
金额：
$ 1.66万
依托单位：
Osaka University
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (A)
财政年份：
1995
资助国家：
日本
起止时间：
1995 至 1996
项目状态：
已结题

来源：
https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-07555605/
关键词：
Polymers Crystal Structure Analysis Electron Diffraction Imaging Plate Direct Method Polymer Single Crystals n-Alkanes Rigid-rod Polymers 電子線回折高分子結晶構造解析単結晶 X線回折反射強度電子顕微鏡

项目摘要

It is still difficult to get the qualified X-ray diffraction data of polymer crystals useful for the quantitative discussion of relationship between structure and physical properties. For these several years we have been making efforts to develop an X-ray structural analysis system equipped with an imaging-plate detector which is highly sensitive and highly quantitative. In this study, for supporting this new system, we have focused our attention onto the electron diffraction data. The polymer single crystals, grown from the dilute solutions, are quite small in size, only a few micrometer, but give beautiful diffraction patterns consisted of many sharp spots. If we can analyze these diffraction patterns in enough quantitative manner, then we should have the highly accurate structural information on polymer crystals. But this type of technique has not yet been enough established. Our main purpose is to develop a new system powerful for solving these problems. The electron microscope was installed, to which the imaging plate was set. A new software was created which was found to be quite useful for the quatitative analysis of the position and integrated intensity of the observed reflections. The actual application of this method has been made successfully to n-alkane crystals and so on : the initial structures could be extracted by the direct method and be refined well.

聚合物晶体的X射线衍射数据难以获得，难以定量地讨论结构与物理性能之间的关系。这几年来，我们一直在努力开发一种配备有成像板检测器的X射线结构分析系统，该系统具有高灵敏度和高定量性。在这项研究中，为了支持这个新系统，我们把注意力集中在电子衍射数据上。从稀溶液中生长的聚合物单晶尺寸很小，只有几个微米，但具有由许多尖锐斑点组成的美丽衍射图案。如果我们能够对这些衍射图样进行足够定量的分析，那么我们就可以获得高分子晶体的高精度结构信息。但这种技术还没有得到充分的发展。我们的主要目的是开发一个新的系统来解决这些问题。安装电子显微镜，将成像板设置到其上。建立了一个新的软件，这是非常有用的定量分析的位置和积分强度的观察到的反射。该方法已成功地应用于正构烷烃等晶体的结构分析中，初始结构可以用直接法提取，并得到很好的精细化。