High-performance measuring station in functional context for high-performance data converters

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The Institute for Microelectronics at the University of Ulm is recognized worldwide for its research into high-performance analog-to-digital converters (ADC). High performance is understood in the context of bandwidth and sampling rates, resolution, linearity and power efficiency, which is often summarized in a Figure of Merit (FOM) in the ADC community. Resolutions up to 20bit, sampling rates in the GS/s range, FOM in the range of >180dB and intrinsic, calibration-free linearities far above 100dB are achieved by research work at the institute. Research results are prototypically realized and measured in a variety of modern processes (180nm XFAB, 28nm TSMC, 22nm GF). For measurements in this performance range, many measurement instruments come to the edge of their capabilities, which is why a high-performance measurement station is necessary in a coordinated configuration of a functional context. This includes: - broadband analog signal recording by means of oscilloscope with high sampling rate and active samples, - mixed-signal oscilloscope for parallel debugging of a large number of analog and digital (test) signals, - broadband signal generator with very low phase noise for clock generation, - broadband signal generators with variable external filtering for realization of a high high input signal quality with low noise and highest linearity, - narrowband signal generator for realization of highest input signal quality with noise and linearity <-120dBFS - low-noise DC sources with line filter for supply and reference generation. The measuring station previously used at the Institute of Microelectronics is obsolete and no longer suitable for planned research work. The submitted large-scale equipment application is intended to enable the Institute of Microelectronics to continue to be one of the world's leading research facilities for high-performance data converters.