权益分类	功能权益	普通用户	{{item.name}}会员
{{category.name}}	{{benefitItem.name}}

Development of nano-scale surface elemental analysis using pulse excitation by evanescent light and evaluation of material functions

利用倏逝光脉冲激发进行纳米级表面元素分析并评估材料功能

基本信息

批准号：
11355034
负责人：
MORISHITA Fujio
金额：
$ 17.63万
依托单位：
KYOTO UNIVERSITY
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (A)
财政年份：
1999
资助国家：
日本
起止时间：
1999 至 2001
项目状态：
已结题

项目摘要

The analysis of the chemical composition, the chemical structure and the chemical state of the local superfine site of the surface of materials is very important for the elucidation of the emergence mechanism of their functions and their properties. It also leads to excellentmethods for controlling their functions and the development of new materials with higher functions.In this work, the authors attempted to develop a new technique using the concept of ultraviolet photoelectron spectroscopy (UPS) and the evanescent light for excitation, which is induced from a capillary probe of scanning nearfield optical microscope. Since the spot size obtained by the evanescent light does not depend on the wavelength but on the aperture of the probe, the evanescent light froma capillary with ultrafine aperture can excite an extremely small local site of the material surface. After a home-made UPS apparatus was constructed, various fundamental discussions were carried out about instrumental and experimental parameters ; the optimal way for preparation of the capillary probe was established and the dispersion property of an energy analyzer with a cylindrical mirror adopted in our apparatus and the amplification property of a channeltron multiplier chosen as the detector were investigated minutely. An electron-oscillation type helium lamp was adopted as the light source since it emits stablyunder low helium pressure and it can be easily connected to a high-vacuumsystem. The discharge characteristics of the helium lamp such as the relationship between the gas pressure and the emission strength were confirmed. UPS spectra on the surface of the palladium-deposited silicon crystal were measured as an application of our method and the change in the surface of the substrate was analyzed in relation to the thermal treatment.

分析材料表面局部超细部位的化学组成、化学结构和化学状态，对于阐明其功能和性质的产生机理具有重要意义。这也导致了控制其功能和开发具有更高功能的新材料的优秀方法。在本工作中，作者试图利用紫外光电子能谱（UPS）的概念和扫描近场光学显微镜毛细管探针诱导的倏逝光激发，开发一种新的技术。由于倏逝光获得的光斑大小与探针孔径无关，而与波长有关，因此超细孔径毛细管发出的倏逝光可以激发材料表面极小的局部区域。国产UPS装置建成后，对仪器参数和实验参数进行了各种基础性讨论；确定了毛细管探针的最佳制备方法，并对仪器中采用的圆柱形镜能量分析仪的色散特性和选择的通道倍增器作为检测器的放大特性进行了详细的研究。采用电子振荡型氦气灯作为光源，因为它在低氦气压力下发光稳定，并且可以方便地连接到高真空系统。确定了氦气灯的放电特性，如气体压力与发射强度的关系。应用该方法测量了镀钯硅晶体表面的UPS光谱，并分析了基体表面的变化与热处理的关系。