Influence of nitrogen active species on electrical breakdown characteristics in enclosed compressed condition

氮活性物质对封闭压缩条件下电击穿特性的影响

• 批准号: 13650318
• 负责人: YUMOTO Motoshige
• 金额: $ 2.56万
• 依托单位: Musashi Institute of Technology
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (C)
• 财政年份: 2001
• 资助国家: 日本
• 起止时间: 2001 至 2003
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-13650318/
• 关键词: Breakdown voltage; Breakdown probability; Time lag; Primary electron; Neutral active species; Quadrupole mass pectrometer; Threshold ionization mass Spectrometry; Bias voltage; 中性活性種; パッシェン特性; 窒素励起分子

Till now, it is confirmed that the breakdown probability increased and the time lag of breakdown becomes short during repetition of the breakdown test in the enclosed vessel. It is deduced that these changes should be brought about by accumulation of neutral active species in the space. To confirm the assumption, the breakdown probability and the time lag of breakdown were measured under the DC bias voltage application.At the beginning of the test, u.v. ray was irradiated on the electrode and electron was emitted into the test gap. Electrons emitted were accelerated by the DC bias voltage and gain energy depending on the magnitude of the voltage. In the case of lower bias voltage, energy gain is small and electrons are swept out from the space. On the other hand, under higher bias voltage, excitation collision may be expected during the drift process. Accordingly, neutral active species are generated and accumulated in the space under the higher bias voltage application.The test result shows that the breakdown probability decreased up to 1 kV and increased above 1 kV. Corresponding to the breakdown probability, the time lag changed depending on the magnitude of the bias voltage. From these results, it is concluded that the assumption is reasonable one. However, it is necessary to try the numerical analysis further.

到目前为止，已证实在密闭容器中重复击穿试验期间，击穿概率增加，击穿时滞变短。推测这些变化应该是空间中性活性物种积累引起的。为了证实这一假设，在直流偏压下测量了击穿概率和击穿时间延迟。在试验开始时，在电极上照射紫外线，并向试验间隙发射电子。发射的电子被直流偏置电压加速，并根据电压的大小获得能量。在较低的偏置电压的情况下，能量增益是小的，并且电子从空间被扫出。另一方面，在较高的偏置电压下，在漂移过程中可能会发生激发碰撞。结果表明，在较高的偏压下，击穿概率在1kV以下降低，在1kV以上增加。对应于击穿概率，时间滞后根据偏置电压的大小而改变。从这些结果可以得出结论，该假设是合理的。然而，有必要进一步尝试数值分析。

项目成果

M.Yumoto: "Influence of corona discharge on breakdown characteristics of compressed nitrogen gas"Proc. International Symposium on High Voltage Engineering. 2. 364-367 (2001)

M.Yumoto：“电晕放电对压缩氮气击穿特性的影响”Proc。

K.Sakurai et al.: "Change of breakdown probability of compressed nitrogen gas"Proc. 13th Inter. Symp. High Voltage Engineering. (CD-ROM). 1-4 (2003)

K.Sakurai 等人：“压缩氮气击穿概率的变化”Proc。

松田 悟司: "しきい値イオン化質量分析法を用いた窒素準安定励起分子の検出"電気学会論文誌A. 123A・2. 167-172 (2003)

Satoshi Matsuda：“使用阈值电离质谱法检测氮亚稳态激发分子”日本电气工程师学会会刊A.123A·2（2003）。

M.Yumoto: "Concentration of Nitrogen Metastable Molecule Measured by the Thershold Ionization Mass Spectrometry Method"Proc. 14^<th> Inter. Conf. Gas Discharges and Their Applications. 2. 60-63 (2002)

M.Yumoto：“通过阈值电离质谱法测量氮亚稳态分子的浓度”Proc。

M.Yumoto: "Concentration of Nitrogen Metastable Molecule Measured by the Threshold Ionization Mass Spectrometry Method"Proc.14^<th> Inter.Conf.Gas Discharges and Their Applications. 2. 60-63 (2002)

M.Yumoto：“通过阈值电离质谱法测量氮亚稳态分子的浓度”Proc.14^<th> Inter.Conf.Gas Disdischarges and Their Applications。