Influence of nitrogen active species on electrical breakdown characteristics in enclosed compressed condition

到目前为止，已证实在密闭容器中重复击穿试验，击穿概率增加，击穿时滞变短。推测这些变化应是中性活性物种在空间中的积累所致。为了验证这一假设，在直流偏置电压作用下测量了击穿概率和击穿时间延迟。射线照射在电极上，电子射入测试间隙。发射的电子被直流偏置电压和增益能量加速，这取决于电压的大小。在较低偏置电压的情况下，能量增益较小，电子从空间中被扫出。另一方面，在较高的偏置电压下，漂移过程中可能会发生励磁碰撞。测试结果表明，在较高的偏置电压下，击穿概率最高可降低到1kV，而在1kV以上，击穿概率有所增加。对应于击穿概率，时间延迟根据偏置电压的大小而改变。从这些结果可以看出，这一假设是合理的。但是，有必要进一步尝试数值分析。

Till now, it is confirmed that the breakdown probability increased and the time lag of breakdown becomes short during repetition of the breakdown test in the enclosed vessel. It is deduced that these changes should be brought about by accumulation of neutral active species in the space. To confirm the assumption, the breakdown probability and the time lag of breakdown were measured under the DC bias voltage application.At the beginning of the test, u.v. ray was irradiated on the electrode and electron was emitted into the test gap. Electrons emitted were accelerated by the DC bias voltage and gain energy depending on the magnitude of the voltage. In the case of lower bias voltage, energy gain is small and electrons are swept out from the space. On the other hand, under higher bias voltage, excitation collision may be expected during the drift process. Accordingly, neutral active species are generated and accumulated in the space under the higher bias voltage application.The test result shows that the breakdown probability decreased up to 1 kV and increased above 1 kV. Corresponding to the breakdown probability, the time lag changed depending on the magnitude of the bias voltage. From these results, it is concluded that the assumption is reasonable one. However, it is necessary to try the numerical analysis further.