Influence of nitrogen active species on electrical breakdown characteristics in enclosed compressed condition

到目前为止，在密闭容器中反复进行击穿试验，已经证实击穿概率增加，击穿滞后时间缩短。推测这些变化是由中性活性物质在空间上的积累引起的。为了验证这一假设，在直流偏置电压作用下测量了击穿概率和击穿滞后时间。在测试开始时，在电极上照射紫外线，并将电子发射到测试间隙中。发射的电子被直流偏置电压加速，并根据电压的大小获得能量。在偏置电压较低的情况下，能量增益较小，电子从空间中被扫出。另一方面，在较高的偏置电压下，漂移过程中可能会发生激励碰撞。因此，在较高的偏置电压作用下，中性活性物质在空间中产生并积累。试验结果表明，在1 kV以下击穿概率减小，在1 kV以上击穿概率增大。与击穿概率相对应，时间滞后随偏置电压的大小而变化。从这些结果可以看出，该假设是合理的。然而，有必要进一步尝试数值分析。

Till now, it is confirmed that the breakdown probability increased and the time lag of breakdown becomes short during repetition of the breakdown test in the enclosed vessel. It is deduced that these changes should be brought about by accumulation of neutral active species in the space. To confirm the assumption, the breakdown probability and the time lag of breakdown were measured under the DC bias voltage application.At the beginning of the test, u.v. ray was irradiated on the electrode and electron was emitted into the test gap. Electrons emitted were accelerated by the DC bias voltage and gain energy depending on the magnitude of the voltage. In the case of lower bias voltage, energy gain is small and electrons are swept out from the space. On the other hand, under higher bias voltage, excitation collision may be expected during the drift process. Accordingly, neutral active species are generated and accumulated in the space under the higher bias voltage application.The test result shows that the breakdown probability decreased up to 1 kV and increased above 1 kV. Corresponding to the breakdown probability, the time lag changed depending on the magnitude of the bias voltage. From these results, it is concluded that the assumption is reasonable one. However, it is necessary to try the numerical analysis further.