Two dimensional element mapping technique SPECT-PIXE using extracted proton beam

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We want to develop a new particle induced X-ray emission measurement of the so-call SPECT-PIXE which has a possibility of 2 dimensional element mapping without the microbeamline. To do this, we try to test that 1) possibility of PIXE using CdTedetector, 2) PIXE using extracted proton beam to air, and also we perform simulations using MCNP particle transport code to design the pin-hole collimator for the put-hole PIXE.We made the above mentioned tests ;1) Simulation which the particle induced and emitted X-ray can be focus using pin-hole collimator had been confirmed.2) As a model device for multi-array CdTe detector, we made a FOS-Image intesifire X-ray camera.3) Experimentally, X ray and gamma ray can be focused using pin-hole collimator developed the X-ray camera.4) Experimentally, X ray and gamma ray can be focused using pin-hole collimator using CdTe array detector. However, the CdTe detector did not have enough energy resolution for charasteristic X ray separation.5) It was shown the CdTe shotkey CdTe array detector or Si-pin-photodiode array detector are sutable for the SPECT PIXE system.6) We make sure PIXE measurements using extracted proton beam.7) We make sure that pin-hole collimator of magnification factor 10 can obtain the 14 μmIn sammry, the proposed new technique of SPECT-PIXE is confiemed a possibility of 2 dimentional element mapping in position resolution about 20 μm. The system will be improved position resolution using X-ray lense such as Frenel-Zone plate.