Two dimensional element mapping technique SPECT-PIXE using extracted proton beam

我们想开发一种新的粒子诱导x射线发射测量，即所谓的SPECT-PIXE，它有可能在没有微光束线的情况下进行二维元素映射。为此，我们尝试测试1)使用CdTedetector进行pxie的可能性，2)使用提取的质子束对空气进行pxie，并且我们还使用MCNP粒子传输代码进行模拟以设计放置孔pxie的针孔准直器。我们做了上述测试；1)利用针孔准直器对粒子诱导和发射的x射线进行了聚焦模拟。2)作为多阵列碲化镉探测器的模型装置，制作了FOS-Image集成x射线相机。3)实验上，研制的X射线相机利用针孔准直器实现了X射线和伽马射线的聚焦。4)实验上，利用CdTe阵列探测器利用针孔准直器实现了X射线和伽马射线的聚焦。然而，CdTe探测器没有足够的能量分辨率来进行特征X射线分离。结果表明，CdTe散键式CdTe阵列探测器或硅脚光电二极管阵列探测器适用于SPECT PIXE系统。6)我们确保使用提取的质子束进行PIXE测量。7)在确定了放大倍数为10的针孔准直器可以获得14 μmIn的样品后，证实了SPECT-PIXE新技术在20 μm左右的位置分辨率下实现二维元素映射的可能性。该系统将采用Frenel-Zone板等x射线透镜提高定位分辨率。

We want to develop a new particle induced X-ray emission measurement of the so-call SPECT-PIXE which has a possibility of 2 dimensional element mapping without the microbeamline. To do this, we try to test that 1) possibility of PIXE using CdTedetector, 2) PIXE using extracted proton beam to air, and also we perform simulations using MCNP particle transport code to design the pin-hole collimator for the put-hole PIXE.We made the above mentioned tests ;1) Simulation which the particle induced and emitted X-ray can be focus using pin-hole collimator had been confirmed.2) As a model device for multi-array CdTe detector, we made a FOS-Image intesifire X-ray camera.3) Experimentally, X ray and gamma ray can be focused using pin-hole collimator developed the X-ray camera.4) Experimentally, X ray and gamma ray can be focused using pin-hole collimator using CdTe array detector. However, the CdTe detector did not have enough energy resolution for charasteristic X ray separation.5) It was shown the CdTe shotkey CdTe array detector or Si-pin-photodiode array detector are sutable for the SPECT PIXE system.6) We make sure PIXE measurements using extracted proton beam.7) We make sure that pin-hole collimator of magnification factor 10 can obtain the 14 μmIn sammry, the proposed new technique of SPECT-PIXE is confiemed a possibility of 2 dimentional element mapping in position resolution about 20 μm. The system will be improved position resolution using X-ray lense such as Frenel-Zone plate.