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Measurement of Thermophysical Properties of Carbon Nanotube using a T-type Nano-probe

使用T型纳米探针测量碳纳米管的热物理性质

基本信息

批准号：
17360098
负责人：
FUJII Motoo
金额：
$ 9.66万
依托单位：
Kyushu University
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (B)
财政年份：
2005
资助国家：
日本
起止时间：
2005 至 2006
项目状态：
已结题

来源：
https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-17360098/
关键词：
Thermal Engineering Carbon Nanotubes Measurement Method Thermal Conductivity Electrical Conductivity Nanofilm

项目摘要

(1) Measurements of the thermal conductivity of individual carbon nanotubes (CNT) have been carried out using a T-type nanosensor. The fabrication procedure of the T-type nanosensor was improved and a method was established to make a hot nanofilm with good quality thermal and electrical characteristics.(2) We developed a measurement method to obtain simultaneously the thermal conductivity of a CNT and thermal contact resistance at the junction point of the CNT and hot nanofilm by changing the CNT length at the same junction condition. With the help of Micro-Electro-Mechanical Systems (MEMS), we succeeded to make a nanoprobe with a step-shaped heat sink. However, it was very difficult to reconstruct the T-type nanosensor for the shorter length CNT and simultaneous measurements have not succeeded yet.(3) Besides the measurement of the thermal conductivity of individual CNTs, the thermal conductivity and electrical conductivity of platinum nanofilms with various thicknesses were measured accurately. The measured values for both thermal and electrical conductivity of the nanofilms were less than half of the bulk values as reported previously.(4) The relation between these conductivities and the thickness and grain size of the nanofilms was investigated in detail and compared with the existing theoretical results. It is clarified that the reduction of the conductivities are mainly caused by the scatter of the electrons at the grain boundary. We could explain the reason why the Wiedemann-Frantz law does not hold for the metallic films with nanoscale thicknesses.(5) The reproducibility was confirmed to be very good and the present method to measure the thermal conductivity of CNTs could be applied widely in practical use.

(1)单个碳纳米管（CNT）的热导率的测量已经使用T型纳米传感器进行。改进了T型纳米传感器的制备工艺，建立了一种制备具有良好热性能和电学性能的热纳米薄膜的方法。(2)我们开发了一种测量方法，通过在相同的结条件下改变CNT长度，同时获得CNT的热导率和CNT和热纳米膜的结点处的接触热阻。在微机电系统（MEMS）的帮助下，我们成功地制作了一个具有台阶形散热器的纳米探针。然而，这是非常困难的重建的T型纳米传感器的较短的长度CNT和同时测量尚未成功。(3)除了测量单个碳纳米管的热导率外，还精确测量了不同厚度的铂纳米膜的热导率和电导率。纳米膜的热导率和电导率的测量值小于先前报道的体积值的一半。(4)这些电导率之间的关系的厚度和晶粒尺寸的纳米薄膜进行了详细的研究，并与现有的理论结果进行了比较。结果表明，电导率的降低主要是由于电子在晶界处的散射引起的。我们可以解释为什么Wiedemann-Frantz定律不适用于纳米厚度的金属薄膜。(5)实验结果表明，该方法具有很好的重现性，可广泛应用于实际生产中。