Research on continuous processing X-ray Cr with material identification by energy discrimination

能量辨别连续加工X射线Cr材料识别研究

• 批准号: 18360167
• 负责人: AOKI Toru
• 金额: $ 10.2万
• 依托单位: Shizuoka University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B)
• 财政年份: 2006
• 资助国家: 日本
• 起止时间: 2006 至 2007
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-18360167/
• 关键词: X-ray CT; Material Identify; continuous processing; energy discrimination; Security inspection; X線; CT; 材料識別; フォトンカウンティング; 連続処理; アルゴリズム; 画像再構成

We study and research on 1. Material identified X-ray CT (Atomic number identification), and 2. Basic research of continuous prccessing type (not batch system) X-rayCT by using our developed photon counting X-ray imaging device, which has energy discrimination function under the conventional X-ray source. The X-ray CT system has been constructed. The microocouse X-ray source for white X-ray source, our developed X-ray imaging device and XYZθ automatic stage was installed into lead-shielded box. The all software were developed in our laboratory We developed, X-ray CT optics and system, measurement control system, signal and image processing and so on. At first, the simulation was carried out for finding optimized condition by theatrically, and then we made some conditions such as a collimator. As a result, the measurement time became possible within the range to atomic number 22 securing enough accuracy of the hanging thing.The improvement of accuracy by the low step measurement was aimed at about one side for continuous processing. It confirmed it fundamentally by supplementing the image quality deterioration because of a step number decrease with the supplementation in shape to specialize in the security inspection purpose.

我们学习和研究1。材料鉴定X射线CT（原子序数鉴定），和2。利用我们研制的在常规X射线源下具有能量鉴别功能的光子计数X射线成像装置进行了连续处理型（非批处理系统）X射线CT的基础研究。建立了X射线CT系统。将白色X射线源、自行研制的X射线成像装置和XYZθ自动工作台安装在铅屏蔽盒内。本课题的软件部分是在本实验室完成的，包括X射线CT光学系统、测量控制系统、信号和图像处理等，首先进行了理论模拟，寻找最佳条件，然后进行了准直器等条件的设计。其结果是，能够在原子序数22以下的范围内进行测定，能够确保吊物的精度。通过低台阶测定提高精度的目的是为了连续处理。它通过补充由于步数减少而导致的图像质量劣化以及专门用于安全检查目的的形状补充从根本上证实了这一点。

项目成果

O.I. Vlasenko Metal-semiconductor interfaces in CdTe crystals and modification of their properties by laserpulses

O.I.

• 发表时间: 2005
• 期刊: Appl. Surf. Sci 249
• 作者: V.A. Gnatyuk;T. Aoki;Y. Hatanaka
• 通讯作者: Y. Hatanaka

O. I. Vlasenko Deect ormation in CdTe during laser-induced doping and application to the manufacturing nuclear radiation detectors

O. I. Vlasenko 激光诱导掺杂过程中 CdTe 中的缺陷形成及其在制造核辐射探测器中的应用

• 发表时间: 2006
• 期刊: Phys. Stat. Sol. C 3
• 作者: V.A. Gnatyuk;T. Aoki;Y. Hatanaka
• 通讯作者: Y. Hatanaka

X-ray, gamma-ray detector/imager by CdTe semiconductor and its applications

CdTe半导体X射线、伽马射线探测器/成像仪及其应用

• 发表时间: 2007
• 作者: T. Aoki;H. Mimura
• 通讯作者: H. Mimura

Application of CdTe photon-counting X-ray imager to material discriminated X-ray CT

CdTe光子计数X射线成像仪在材料辨别X射线CT中的应用

• 发表时间: 2007
• 期刊: Prof. of SPIE 6706
• 作者: T. Nakashima;H. Morii;Y. Neo;H. Mimura;T. AOki
• 通讯作者: T. AOki

CdTe X-ray sensing driven by electron beam from filed emitters

由场发射器的电子束驱动的 CdTe X 射线传感

• 发表时间: 2007
• 期刊: J. Vac. Sci. Technol. B 25(2)
• 作者: Y.Neo;Y.Ikeda;T.Sakata;H.Morii;K.Shiozawa;T.Aoki;H.;Mimura
• 通讯作者: Mimura