Direct observation of electronic structure at the hetero-interface of trongly-correlated oxides studied by hard x-ray photoemission spectroscopy

为了阐明强关联氧化物异质界面反常物理性质的来源，我们用硬X射线光电子能谱直接观测了氧化物异质界面的电子结构。我们用硬X射线光电子能谱成功地获得了电子结构随深度的变化，并阐明了几种强关联氧化物薄膜的电子结构和异质结构。

In order to clarify the origin of unusual physical properties at hetero-interfaces of strongly-correlated oxides, we have performed the direct observation of electronic structure at the oxide hetero-interfaces using hard x-ray photoemission spectroscopy. We have succeeded in obtaining the depth-dependence of the electronic structure using hard x-ray photoemission spectroscopy, and clarified the electronic structures of several strongly-correlated oxide thin films and hetero-structures.