Defect-oriented test generation based on fault excitation functions

在深亚微米工艺制造高性能LSI的背景下，为了降低测试成本，提高各种缺陷的测试质量，有必要开发测试CAD工具。在这项研究中，我们提出了固定故障、桥接故障、完全断开的开路故障、过渡故障、阻性桥接故障和阻性开路故障的故障激励函数。提出了一种基于故障激励函数的面向缺陷的测试生成方法和基于故障激励函数的故障诊断方法。对ISCAS基准电路的实验结果表明，与现有方法相比，该方法可以获得更好的故障覆盖率和更小的诊断分辨率。

Under the high-performance LSI fabricated with deep submicron technology, the development of test-CAD tools is necessary to reduce the test cost and to improve the quality for various defects. In this study, we propose fault excitation functions for stuck-at fault, bridging faults, complete disconnected open faults, transition faults, resistive bridging faults, and resistive open faults. We also propose a defect-oriented test generation method based on the fault excitation functions and a fault diagnosis method by using the fault excitation functions. The experimental results for ISCAS benchmark circuits demonstrated that the proposed methods can achieve the better fault coverage and the smaller diagnostic resolutions compared with the existing methods.