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Defect-oriented test generation based on fault excitation functions

基于故障激励函数的面向缺陷的测试生成

基本信息

批准号：
20500051
负责人：
HIROSHI Takahashi
金额：
$ 2.83万
依托单位：
Ehime University
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (C)
财政年份：
2008
资助国家：
日本
起止时间：
2008 至 2010
项目状态：
已结题

项目摘要

Under the high-performance LSI fabricated with deep submicron technology, the development of test-CAD tools is necessary to reduce the test cost and to improve the quality for various defects. In this study, we propose fault excitation functions for stuck-at fault, bridging faults, complete disconnected open faults, transition faults, resistive bridging faults, and resistive open faults. We also propose a defect-oriented test generation method based on the fault excitation functions and a fault diagnosis method by using the fault excitation functions. The experimental results for ISCAS benchmark circuits demonstrated that the proposed methods can achieve the better fault coverage and the smaller diagnostic resolutions compared with the existing methods.

在采用深亚微米技术制造的高性能LSI下，需要开发测试CAD工具来降低测试成本并提高各种缺陷的质量。在本研究中，我们提出了针对固定故障、桥接故障、完全断开开路故障、过渡故障、阻性桥接故障和阻性开路故障的故障激励函数。我们还提出了一种基于故障激励函数的面向缺陷的测试生成方法和一种利用故障激励函数的故障诊断方法。 ISCAS基准电路的实验结果表明，与现有方法相比，所提出的方法可以实现更好的故障覆盖率和更小的诊断分辨率。