Investigation of physical properties of magnetic thin film with atomic force microscopy in extreme field

点击翻译按钮获取中文摘要

I developed several measuring techniques of noncontact atomic force microscopy for investigating physical properties at the atomic scale such as magnetism, electron charge and elastic distribution on a surface. First, I invented the multifrequency frequency modulation atomic force microscopy (MF-FM-AFM) and performed its observation on semiconductor surfaces at room temperature. The elasticity information of the surfaces was successfully obtained at the atomic scale. Therefore I demonstrated the MF-FM-AFM is expected to be useful for the investigation of the surface elasticity at the atomic scale. In addition, I found and verified the novel method of extracting the magnetic exchange interaction on a surface from the total interaction working between AFM tip and the surface using micro wave.