A method for strain measurement using digital holography with a micro-retarder array

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An approach to simultaneous acquisition of phase-stepped interferograms using a CCD camera equipped with a pixelated micro-retarder array is proposed for digital holographic interferometry. The effectiveness of the proposed method is demonstrated by applying to the deflection measurement of a beam and the measurement of time-varying strain of an electric device under thermal load. Results show that the time-variant displacements and the strains can be measured by the proposed method.