A method for measuring time-variant strain distributions usingimaging polarimetry

一种利用成像偏振测量时变应变分布的方法

• 批准号: 22760083
• 负责人: YONEYAMA Satoru
• 金额: $ 1.83万
• 依托单位: Aoyama Gakuin University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Young Scientists (B)
• 财政年份: 2010
• 资助国家: 日本
• 起止时间: 2010 至 2011
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-22760083/
• 关键词: 機械材料・材料力学; ひずみ測定; 画像処理; 干渉; 偏光

A method for analyzing the fringe pattern from a single image is proposed for interferometry and photoelasticity. The emerging light from a polariscope or an interferometer is analyzed using anoptical setup of a polarimeter that is composed of two Savart plates, a half-wave plate, and an analyzer. Then, the distributions of the Stokes parameters are obtained. The phase distribution of the fringe pattern produced by the interferometer is then calculated from these Stokes parameters. Similarly, the phases of the isochromatics and the isoclinics in photoe-lasticity are obtained by analyzing the emerging light from the polariscope. The effectiveness of the proposed method is validated by simple experiments of interferometry and photoelasticity. Results show that the fringe pattern analysis from a single image is possible by the proposed meth-od.

提出了一种用于干涉测量和光弹性测量的单幅图像条纹分析方法。使用由两个Savart板、半波片和分析器组成的偏振器的光学装置来分析来自偏振镜或干涉仪的出射光。然后，得到了斯托克斯参数的分布。然后根据这些斯托克斯参数计算干涉仪产生的条纹图样的相位分布。类似地，通过分析偏光镜出射的光，得到了光弹性等色线和等倾角的位相。通过简单的干涉测量和光弹性实验验证了该方法的有效性。结果表明，该方法可以对单幅图像进行条纹图分析。

项目成果

Interference and Photoelastic Fringe Pattern Analysis Using Snapshot Imaging Polarimetry

使用快照成像偏振法进行干涉和光弹性条纹图案分析

• 发表时间: 2011
• 作者: 米山聡;有川秀一;釘山雄資
• 通讯作者: 釘山雄資

Determining Stress Components from Isopachic Contours Using Airy Stress Function

使用艾里应力函数从等距轮廓确定应力分量

• 发表时间: 2010
• 作者: S.Yoneyama;K.Okuno
• 通讯作者: K.Okuno