The measurement of LHD plasmas using X-ray imaging polarimeter

使用 X 射线成像旋光计测量 LHD 等离子体

• 批准号: 20740320
• 负责人: SAKURAI Ikuya
• 金额: $ 2.83万
• 依托单位: Nagoya University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Young Scientists (B)
• 财政年份: 2008
• 资助国家: 日本
• 起止时间: 2008 至 2010
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-20740320/
• 关键词: プラズマ; X線; 偏光計

We developed an X-ray imaging polarimeter to measure the X-ray polarization from high temperature plasmas on the Large Helical Device (LHD). The X-ray polarimeter is based on the photoelectric effect in gas to detect X-ray polarization. In order to trace a photoelectron track in the gas, we have to measure the electron distribution which is produced by a photoelectron ionizing the gas. Therefore, we make use of the Gas Electron Multiplier (GEM), which the number of electron is multiplied without losing the information of electron distribution. And multiplied electron are detected by the underneath CMOS sensor without a CdTe layer. It is a fine pixelized electron reader with the usable area of 2.5×2.5cm^2. We detected the X-ray polarization from the Fe Kα, which energy was 6.4keV. But CMOS sensor breaks down for an electric discharge before measure the LHD plasmas. So, we could not carry out the measurements of LHD plasmas using X-ray polarimeter.

我们研制了一台X射线成像偏振仪，用于测量大型螺旋装置(LHD)上高温等离子体的X射线偏振度。X射线偏振仪是基于气体中的光电效应来检测X射线偏振的。为了追踪气体中的光电子轨迹，我们必须测量光电子电离气体所产生的电子分布。因此，我们利用气体电子倍增器(GEM)，在不丢失电子分布信息的情况下，将电子的数目相乘。和倍增的电子被不带CdTe层的下面的CMOS传感器检测到。它是一个使用面积为2.5×2.5 cm~2的细像素化电子阅读器。我们从Fe-Kα上测量到了能量为6.4keV的X射线偏振。但是，在测量LHD等离子体之前，由于放电，CMOS型传感器发生了故障。因此，我们无法用X射线偏振仪对LHD等离子体进行测量。

项目成果

Edge and Core Impurity Transport Study with Spectroscopic Instruments in LHD

• DOI: 10.1088/1009-0630/11/4/07
• 发表时间: 2009-08
• 期刊: Plasma Science & Technology
• 影响因子: 1.7
• 作者: S. Morita;M. Goto;M. Kobayashi;S. Muto;M. Chowdhuri;Dong Chunfeng;Zhou Hangyu;Cui Zhengying;K. Fujii;A. Furuzawa;M. Hasuo;A. Iwamae;Jie Yin-xian;M. Koubiti;I. Sakurai;Y. Tawara;Wan Baonian;Wu Zhenwei;N. Yamaguchi