Carrier lifetime evaluation in organic semiconductor by low-frequency noise measurement

通过低频噪声测量评估有机半导体中的载流子寿命

• 批准号: 21760008
• 负责人: AZUMA Yasuo
• 金额: $ 2.41万
• 依托单位: Tokyo Institute of Technology
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Young Scientists (B)
• 财政年份: 2009
• 资助国家: 日本
• 起止时间: 2009 至 2010
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-21760008/
• 关键词: 有機分子; ノイズ計測; 有機半導体

Carrier lifetime in semiconductors is evaluated by low-frequency noise measurements. In Si, carrier lifetime is evaluated as in the order of 100 μs. Temperature dependence of carrier lifetime in Si shows that carrier scattering mechanism changes from ionized impurity scattering to phonon scattering. In pentacene, carrier lifetime is evaluated as in the order of 100 μs. Temperature dependence of carrier lifetime in pentacene implies that carrier transport mechanism changes from hopping transport to band transport.

半导体中的载流子寿命通过低频噪声测量来评估。在Si中，载流子寿命被评估为100 μs的量级。Si中载流子寿命的温度依赖性表明，载流子散射机制从电离杂质散射转变为声子散射。在并五苯中，载流子寿命被评估为100 μs的量级。并五苯中载流子寿命的温度依赖性表明载流子输运机制由跳跃输运转变为带输运。

项目成果

ノイズ計測によるペンタセン薄膜中のキャリアの寿命の評価

通过噪声测量评估并五苯薄膜中的载流子寿命

• 发表时间: 2009
• 作者: 原田佑介;東康男;山田亮;夛田博一
• 通讯作者: 夛田博一

Contact resistance reduction at S/D electrodes-petancene interface by porphyrin self-assembled monolayers in organic thin-film transistors

有机薄膜晶体管中卟啉自组装单分子层降低 S/D 电极-金刚烯界面的接触电阻

• 发表时间: 2010
• 作者: Yasuo Azuma;Taiyo Suzuki;Yasuyuki Yamada;Kentaro Tanaka;Masayuki Kanehara,Toshiharu Teranishi;Yutaka Majima
• 通讯作者: Yutaka Majima