Three-dimensional mapping of electrical transport characteristics in organic semiconductors using independently-driven four-probe method

点击翻译按钮获取中文摘要

We have developed an independently driven four-probe method to investigate field-effect transistor (FET) characteristics in organic semiconductors. The independently driven four-probe method enables us to investigate local FET characteristics in organic semiconductors without damaging the samples. We demonstrated four-probe FET measurement on a pentacene thin film, and we have succeeded to obtain single grain mobility in the polycrystalline pentacene film.