Plastic deformation mechanism of covalent single crystal semiconductor, and development on x-ray point focusing monochromator and analyzing crystal

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Single crystal semiconducting wafers such as silicon and germanium are widely used for monochromators or analyzers of X-rays thanks to their excellent crystallographic quality. However, owing to their brittleness due to their intrinsic nature, they are easily broken when strong deformation is applied. In the present work, by using plastic deformation of them at the temperatures just below the melting points of them, the author realized a Johansson type point-focusing monochromator with R=300mm concave surface, much higher efficiency and shorter focal length than that of conventional ones, and realized also integrated conical analyzer which make it possible to simultaneous focusing of several characteristic lines onto the detector plane of a small-area (20×20mm) X-ray CCD. The present results are breakthrough in X-ray spectrometry.