Inelastic X-ray scattering studies of a novel electronic state induced by the interferences among multiple low-energy excitations

为了阐明材料中声子的色散关系和声子激发的性质，进行了高分辨率的非弹性X射线散射。我们应用这种技术的声子激发和电子激发，如晶体电场（CEF）激发起源于强关联f-电子系统中的f-电子之间的干涉现象的调查。在PrOs_4Sb_1-PrRu_4Sb_2系统中，我们成功地观察到了声子与CEF激发之间的干涉现象<12><12>。我们还研究了声子与f电子引起的电荷涨落之间的干涉现象。

High resolution inelastic X-ray scattering has been carried out in order to elucidate phonon dispersion relations and nature of phonon excitations in materials. We applied this technique to the investigation of interference phenomena between phonon excitation and electronic excitations such as crystal electric field (CEF) excitations originated from f-electrons in strongly correlated f-electron systems. We succeeded in the observation of the interference phenomenon between a phonon and CEF excitations inPrOs_4Sb_<12>-PrRu_4Sb_<12> system. We also investigated interference phenomena between phonon and charge fluctuation due to f-electrons.