Development of electron-impact ion source using RF electric field for enhancing ionization rate of thermal ionization mass spectrometer

利用射频电场提高热电离质谱仪电离率的电子轰击离子源的研制

• 批准号: 22550089
• 负责人: OHZU Akira
• 金额: $ 3.33万
• 依托单位: Japan Atomic Energy Agency
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (C)
• 财政年份: 2010
• 资助国家: 日本
• 起止时间: 2010 至 2012
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-22550089/
• 关键词: 機器分析; 同位体比分析; ｲｵﾝ源; 質量分析器; 高周波; 表面電離; 熱電離; フィラメント; イオン化率; イオン源; レーザーイオン化

Development of electron-impact ion source using RF electric field has been conducted aiming at the enhancement of ionization rate of thermal ionization mass spectrometer. The RF (200-250 MHz) electric field was applied between the evaporation and ionization filament closely built in an ion source via one side of the filaments. Total amount of ions created from the ion source was detected by a Faraday cup, and then ions of individual elements were measured with a Q-mass spectrometer. It was clearly observed that the amount of ions was enhanced with the increase of the RF input power. The experimental results indicate that the RF electric field is effective to the enhancement of ionization rate of the thermal ionization mass spectrometry.

为了提高热电离质谱仪的电离速率，进行了射频电场电子冲击离子源的研制。将射频（200-250 MHz）电场施加于紧靠在离子源内的蒸发和电离灯丝之间。用法拉第杯检测离子源产生的离子总量，然后用q -质谱仪测量单个元素的离子。可以清楚地观察到，离子的数量随着射频输入功率的增加而增加。实验结果表明，射频电场能有效地提高热电离质谱法的电离率。