Development of a in-situ Lorentz microscopy in alternating magnetic field with magnetic head and probe-piezodriving specimen holder

为了发展透射电子显微镜的动态磁场观测技术，将硬盘写入磁头固定在探头驱动的透射式电子显微镜样品固定器的探头上。为了建立这一技术，直接用电子全息技术评估了磁头产生的磁场。此外，在实际的磁畴结构观察中，由于观察的系统样品制备困难，因此进行了分析磁畴壁与人工产生的材料缺陷的相互作用的尝试。

The magnetic head for hard disk writing is attached to a probe of the probe-piezodriving specimen holder for transmission electron microscopy (TEM), in order to develop the dynamic magnetic field observation technique of TEM. In order to establish this technique, the magnetic field generated by a magnetic head was evaluated directly by electron holography technique. Moreover, in actual magnetic domain structure observation, since the systematic sample preparation for observation was difficult, the trial which analyzes the interaction of a magnetic domain wall and the material defect produced artificially was performed.