Development for X-ray crystal structure analysis of a surface-shallow layer and epitaxial growth of single-crystal thin film

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The surface film crystals of the chloro-bridged one-dimensional platinum(II,IV) complex have been prepared by epitaxial growth from the aqueous solution on substrate crystals of the bromo-bridged complex. The grazing incidence X-ray diffraction experiments were made using 8 keV micro-focus X-ray beam. X-ray intensities have been measured for both the epitaxial crystal and the substrate crystal having wide and flat surface with unevenness less than 0.15 micron, and corrected for Lp and absorption effects to give the observed intensities. Conventional R indexes calculated for the observed and calculated intensities are 0.04~0.10 for the flat substrate crystal. Although, for the surface film of epitaxial crystal, R indexes are greater than 0.50 for all the observed data, R reduce to 0.03~0.10 for the data appropriately observed. This suggests that X-ray crystal structure analysis of a surface-shallow layer should be a powerful tool to determine three-dimensional surface structure.