Development of attenuated total reflection-far-ultraviolet spectrometer for ultra surface and its application to ultra surface analysis of polymers

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We have developed an attenuated total reflection-far-ultraviolet spectrometer for a solid ultra surface. This instrument enables us to explore the surface (-50 nm) structure of a bulk solid sample. As applications we measured ATR-FUV spectra (145-250 nm) of various kinds of polyethylenes and Nylons. Based on a comparison of the ATR spectra of polyethylenes with different densities with the corresponding transmittance spectra and that with spectra of liquid and solid n-alkans we obtained the correlation between electronic structure and surface structure. For Nylons we have carried out similar studies. For both cases we have used quantum chemical calculations to investigate band assignments and the relation between spectra and structure. In this way we have succeeded in developing the novel method for solid ultra surface.