Nano X-ray magnetometry in a single magnetic dot in bit-patterned media

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A nano X-ray magnetometry technique was developed to analyze the magnetic properties of bit-patterned media, a candidate for the next-generation high-density magnetic storage, in an atomic level. A brilliant synchrotron radiation X-ray beam was successfully focused to a spot of 100 nm in diameter and enabled X-ray magnetic circular dichroism spectroscopy and element-specific magnetic analysis with this beam size. The technique has been applied to CoPt bit-patterned media sample. Magnetization reversal processes of a single magnetic dot of a 200 nm diameter were elucidated and the microscopic origin of the switching field distribution was discussed. Towards ultimate analysis of real terabit media, a preliminary result in a smaller 36 nm diameter dot has recently been obtained.