Development of system for measurement of phase refractive and group refractive dispersions by broadband interferometer

宽带干涉仪相折射和群折射色散测量系统的研制

• 批准号: 23560047
• 负责人: HIRAI Akiko
• 金额: $ 3.33万
• 依托单位: National Institute of Advanced Industrial Science and Technology
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (C)
• 财政年份: 2011
• 资助国家: 日本
• 起止时间: 2011 至 2013
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-23560047/
• 关键词: 屈折率; 群屈折率; 分散; 干渉計測; 広帯域光干渉計; チャネルドスペクトル; 光計測

Precise information on refractive index and its dispersion of optical material is required in many fields of optical science and industry. There are only a few measurement techniques to measure refractive index with the order of 10-5 to 10-6 uncertainty and these techniques can be available only for monochromatic light source such as lasers and emission lines of spectral lamps. Therefore these techniques directly provide only the refractive index at a certain wavelength but don't provide refractive index dispersion.A new technique that directly measures phase refractive index dispersion and group refractive index dispersion is proposed. The technique is a combination of a broadband light source, variable path interferometer, optical path compensation system and a spectrometer. The principle of the proposed technique was confirmed by simulation.

光学材料折射率及其色散的精确信息在光学科学和工业的许多领域都是需要的。只有少数几种测量技术可以测量10-5到10-6不确定度的折射率，这些技术只能用于单色光源，如激光和光谱灯的发射线。因此，这些技术只能直接测量某一波长的折射率，而不能直接测量折射率色散。提出了一种直接测量相位折射率色散和群折射率色散的新技术。该技术是宽带光源、可变光路干涉仪、光路补偿系统和光谱仪的组合。通过仿真验证了该技术的原理。

项目成果

長さ標準研究室

长度标准实验室