Development of charging sensor using semiconductor with ultra-high resolution and charging analysis of spacecraft materials irradiated by proton

航天器总是暴露于等离子体和/或放射性射线，如γ射线、γ射线和γ射线。当航天器被包裹以保持温度稳定的绝缘材料受到放射线照射时，有时会发生由于静电放电引起的意外事故。然而，它还不知道如何辐照影响的材料的电性能的变化。因此，由于卫星研制需要在轨卫星表面材料的带电信息和带电现象，我们研制了高抗辐射率在轨卫星表面材料带电测量系统。在本文中，我们开始开发新的半导体传感器充电测量传感器使用脉冲电声（PEA）方法。此外，我们还专注于一个内部充电现象，辐照聚酰亚胺的航天器使用小PEA系统的照射使用现有的聚合物压电传感器。

The spacecraft is always exposed to plasma and/or radioactive-rays such as 〓, 〓 and 〓-rays. When the insulating materials, in which the spacecraft is wrapped to keep temperature in it stable, are irradiated by the radioactive-rays, sometimes an unexpected accident due to an electrostatic discharge occurs. However, it has not known how the irradiation affects to change of the electrical properties of the materials. Therefore, as the satellite development needs the charging information and charging phenomena of surface materials of satellite on the orbit, we have developed the charging measurement system of it on the orbit with high radioactive-rays resistivity. In this paper, we started to develop new semiconductor sensor for charging measurement sensor using Pulsed electroacoustic (PEA) method. Furthermore, we also focused on an internal charging phenomenon on irradiated polyimide for spacecraft using small PEA system for irradiation using present polymer piezo sensor.