High-speed, High-resolution and Non-destructive Characterization Technique for Next-generation HTS Wire as a Fundamental Technology for Its Application to Electric Power Devices

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High-speed, high-resolution and non-destructive characterization technique for 2nd-generation high-temperature superconducting (2G HTS) wire has been successfully developed in this program. Improving the characterization speed to 200 times faster, the technique has finally visualized in-plane distribution of local critical current density for a 2G HTS wire at a characterization speed equivalent of itsmanufacturing speed with the spatial resolution of 1 mm. This technique will be a very powerful tool for overcoming the problem of spatial inhomogeneity in 2G HTS wires intended to electric power applications