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MICROSTRUCTURAL CONTROL OF THE INTERFACE FOR SPIN-VALVE GMR THIN-FILMS BY APPLYING THE ULTRA CLEAN SPUTTERING PROCESS

MICROSTRUCTURAL CONTROL OF THE INTERFACE FOR SPIN-VALVE GMR THIN-FILMS BY APPLYING THE ULTRA CLEAN SPUTTERING PROCESS
超洁净溅射工艺对自旋阀巨磁阻薄膜界面微观结构的控制
批准号:
09355010
负责人:
TAKAHASHI Migaku
金额:
$19.2万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (A)
财政年份:
1997
资助国家:
日本
项目状态:
已结题
起止时间:
1997 至 1999

项目摘要

项目成果

TAKAHASHI Migaku的其他基金

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中文摘要
翻译
extremely clean sputtering process (XC process) was newly introduced in The构造过程ultra-thin spin valves to control the microstructure and to establish the excellent magneticproperties. The relation between cleanness during film deposition process and The magneticproperties of spin valve elements has been discussed in connection with their microstructure。Sub./Ta/Ni-Fe/Mn-Ni/Ni-Fe and Sub./Ta/Ni-Fe/Mn-Ir/Ta quadrilayers fabricated under thedifferent purity of the sputtering atmospheres. Strength of the exchange anisotropy measured at roomtemperature was增强in very thin F/AF bilayer fabricated under the XC-process,comparing with the bilayer fabricated under a lower graded (log -) process,which only differed in the base pressure of the sputtering chamber:D1-7 D1 Torr order. From a structural analysis and a temperature dependence of the exchangeanisotropy of the bilayers,grains in the bilayers fabricated under the XC-process were found to be enlarged a…the enhancement of exchange anisotropy was caused by the enlargement ofantiferromagnetic grains,which suppress thermal agitation and lowering the local blocking temperature For the electrontransport,the enlargement of the grains observed in the dc -processed films also played an important role. thedecrease of grain boundaries and impurities in the filmsreduced saturated resistivity of the spin valves, Sub. Ta/Ni-Fe/Co/Cu/Co/Mn-Ir/Ta,with lowering the impurity level in the sputtering atmosphere and resulted in the increase of the MRratios. The MR ratio of tan optimized spin valve fabricated under The XC-process achieved to 9.7%even in the total thickness of 148【encircledA】except for the capping Ta layerwhile that of the LG-processed spin valve dropped to 0.9% due to the vanish of the exchange我们包括extremely clean sputtering process is greatly effective to realizeultra-thin spin valves and that to avoid rumpling interfaces of他们it important to induce theadequate magnetic properties. Less
英文摘要
The extremely clean sputtering process (XC process) was newly introduced in the fabrication of ultra-thin spin valves to control the microstructure and to establish the excellent magnetic properties. The relation between cleanness during film deposition process and the magnetic properties of spin valve elements has been discussed in connection with their microstructure. Sub./Ta/Ni-Fe/Mn-Ni/Ni-Fe and Sub./Ta/Ni-Fe/Mn-Ir/Ta quadrilayers were fabricated under the different purity of the sputtering atmospheres. Strength of the exchange anisotropy measured at room temperature was enhanced in very thin F/AF bilayer fabricated under the XC-process, comparing with the bilayer fabricated under a lower graded (LG-) process, which only differed in the base pressure of the sputtering chamber : 10ィイD1-7ィエD1 Torr order. From a structural analysis and a temperature dependence of the exchange anisotropy of the bilayers, grains in the bilayers fabricated under the XC-process were found to be enlarged a … More nd that the enhancement of exchange anisotropy was caused by the enlargement of antiferromagnetic grains, which suppress thermal agitation and lowering the local blocking temperature. For the electron transport, the enlargement of the grains observed in the XC-processed films also played an important role. The decrease of grain boundaries and impurities in the films, reduced saturated resistivity of the spin valves, Sub. Ta/Ni-Fe/Co/Cu/Co/Mn-Ir/Ta, with lowering the impurity level in the sputtering atmosphere and resulted in the increase of the MR ratios. The MR ratio of tan optimized spin valve fabricated under the XC-process achieved to 9.7%, even in the total thickness of 148 【encircledA】 except for the capping Ta layer, while that of the LG-processed spin valve dropped to 0.9% due to the vanish of the exchange anisotropy. We concluded that the extremely clean sputtering process is greatly effective to realize ultra-thin spin valves and that to avoid rumpling interfaces of them it important to induce the adequate magnetic properties. Less
期刊论文(0)
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科研奖励(0)
会议论文
M.Tsunoda: "Microstructure of antiferromagnetic layer affecting on magnetic exchange coupling in trilayered Ni-Fe/25at%Ni-Mn/Ni-Fe films"Journal of Magnetism & Magnetic Materials. 171. 29-44 (1997)
M.Tsunoda:%20《微观结构%20of%20反铁磁性%20层%20影响%20on%20磁性%20交换%20耦合%20in%20三层%20Ni-Fe/25at%Ni-Mn/Ni-Fe%20films》期刊%20of%20Magnetics
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通讯作者:
K.Uneyama: "Influence of gas adsorption at the interface on the exchange coupling field of Ni-Fe/25at%Ni-Mn/Ni-Fe films"IEEE Transactions on Magnetics. 33. 3685-3687 (1997)
K.Uneyama:%20“影响%20of%20gas%20adsorbation%20at%20the%20interface%20on%20the%20exchange%20coupling%20field%20of%20Ni-Fe/25at%Ni-Mn/Ni-Fe%20films”IEEE
DOI: --
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K.Uneyama: "Influence of gas adsorption at the interface on the exchange coupling field of Ni-Fe/25 at % Ni-Mn/Ni-Fe films"IEEE Transactions on Magnetics. 33. 3685-3687 (1997)
K.Uneyama:%20"影响%20of%20gas%20吸附%20at%20the%20界面%20on%20the%20交换%20耦合%20场%20of%20Ni-Fe/25%20at%20%%20Ni-Mn/Ni-
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M.Tsunoda: "Microstructure and giant magnetoresistance of Co-Cu granular films fabricated under the extremely clean sputtering process"Journal of Applied Physics. 83. 7004-7006 (1998)
M.Tsunoda:“极洁净溅射工艺下制造的 Co-Cu 颗粒薄膜的微观结构和巨磁阻”应用物理学杂志。
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共 28 条
    Creation of Spin-Nanostructure with Extreme High Magnetic Moment
    • 批准号:
      21226007
    • 项目类别:
      Grant-in-Aid for Scientific Research (S)
    • 资助金额:
      $130.96万
    • 财政年份:
      2009
    • 负责人:
      TAKAHASHI Migaku
    • 依托单位:
    Development of spin-nanocluster based material for highly qualified electronic device in GHz band
    • 批准号:
      18206030
    • 项目类别:
      Grant-in-Aid for Scientific Research (A)
    • 资助金额:
      $31.28万
    • 财政年份:
      2006
    • 负责人:
      TAKAHASHI Migaku
    • 依托单位:
    Development of spin funneling magnetic field sensor devices for high sensitive and high space-resolution magnetic imaging plates
    • 批准号:
      14205060
    • 项目类别:
      Grant-in-Aid for Scientific Research (A)
    • 资助金额:
      $33.53万
    • 财政年份:
      2002
    • 负责人:
      TAKAHASHI Migaku
    • 依托单位:
    THERMALLY STABLE ULTRA HIGH DENSITY THIN FILM MAGNETIC MEDIA
    • 批准号:
      10305027
    • 项目类别:
      Grant-in-Aid for Scientific Research (A)
    • 资助金额:
      $5.57万
    • 财政年份:
      1998
    • 负责人:
      TAKAHASHI Migaku
    • 依托单位: