Next generation material imaging, spectrometry and fabrication techniques

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This project aims to solve a common, fundamental problem limiting the performance of mass spectrometers and high resolution electron microscopes: surface modification caused by unintended chemical reactions due to electron impact. The intended project outcomes will advance current understanding of electron restructuring of surfaces and open the door to next-generation material imaging, spectrometry and fabrication techniques. It will develop a superior detector for mass spectrometry and improve the imaging and nanofabrication capabilities of state-of-the-art electron microscopes.